Electrical characterization and current transportation in metal Dy2 O3 Si structure

Journal of Applied Physics

Volumn 102, Issue 4, 2007, Pages

  Chiu, Fu Chien ^a  

^a MING CHUAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ARRHENIUS PLOTS; CHARACTERIZATION; DYSPROSIUM; ELECTRIC CONDUCTIVITY; ELECTRIC SPACE CHARGE; RELAXATION TIME; SCHOTTKY BARRIER DIODES; SILICON; THIN FILMS;

CURRENT TRANSPORTATION; ELECTRICAL CHARACTERIZATION; OHM'S LAW; TRAP DENSITY;

MOS CAPACITORS;

EID: 34548425156     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2767380     Document Type: Article

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