Scanning nonlinear dielectric microscopy with nanometer resolution

Applied Physics Letters

Volumn 75, Issue 18, 1999, Pages 2833-2835

  Cho, Yasuo ^a   Kazuta, Satoshi ^a   Matsuura, Kaori ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000683798     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125165     Document Type: Article

References (7)

1. Y. Cho, A. Kirihara, and T. Saeki, Denshi Joho Tsushin Gakkai Ronbunshi 78-c-1, 593 (1995) [in Japanese].
2. Y. Cho, A. Kirihara, and T. Saeki, Rev. Sci. Instrum. 67, 2297 (1996).
3. Y. Cho, A. Kirihara, and T. Saeki, Jpn. J. Appl. Phys., Part 1 36, 360 (1997).
4. Y. Cho, S. Atsumi, and K. Nakamura, Jpn. J. Appl. Phys., Part 1 36, 3152 (1997).
5. Y. Cho, Oyo Butsuri 67, 327 (1998) [in Japanese].
6. Y. Cho, K. Matsuura, and J. Kushibiki, Jpn. J. Appl. Phys., Part 1 37, 3132 (1998).
7. C. Gao, F. Duewer, Y. Lu, and X.-D. Xiang, Appl. Phys. Lett. 73, 1146 (1998).