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Volumn 428, Issue 1-2, 2003, Pages 93-97

Improvements of the lateral resolution of the MFM technique

Author keywords

MFM imaging; Preparation of tips; Resolution; Soft magnetic samples

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; MAGNETIC MOMENTS; MICROSCOPIC EXAMINATION;

EID: 0037457113     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01278-6     Document Type: Conference Paper
Times cited : (38)

References (19)
  • 1
    • 0345252034 scopus 로고    scopus 로고
    • J. Amelinckx, D. van Dyck, J. van Landhuyt, & G. van Tendeloo (Eds.), Weinheim: VCH-Verlag
    • Wadas A. Amelinckx J., van Dyck D., van Landhuyt J., van Tendeloo G. Handbook of Microscopy. Methods II. 1997;845 VCH-Verlag, Weinheim.
    • (1997) Handbook of Microscopy. Methods II , pp. 845
    • Wadas, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.