-
2
-
-
0033279576
-
-
MRS Symposium Proceedings No. 564 (Materials Research Society, Pittsburgh)
-
A. R. Ivanova, C. J. Galewski, C. A. Sans, T. E. Seidel, S. Grunow, K. Kumar, and A. E. Kaloyeros, Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, MRS Symposium Proceedings No. 564 (Materials Research Society, Pittsburgh, 1999), pp. 321-326.
-
(1999)
Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics
, pp. 321-326
-
-
Ivanova, A.R.1
Galewski, C.J.2
Sans, C.A.3
Seidel, T.E.4
Grunow, S.5
Kumar, K.6
Kaloyeros, A.E.7
-
4
-
-
0022223940
-
-
MRS Symposia Proceedings No. 47 (Materials Research Society, Pittsburgh),.
-
K. Affolter, H. P. Kattelus, and M.-A. Nicolet, Thin Films: The Relationship of Structure to Properties, MRS Symposia Proceedings No. 47 (Materials Research Society, Pittsburgh, 1985), p. 167-173.
-
(1985)
Thin Films: The Relationship of Structure to Properties
, pp. 167-173
-
-
Affolter, K.1
Kattelus, H.P.2
Nicolet, M.-A.3
-
5
-
-
0026255252
-
-
P. J. Pokela, C. K. Kwok, E. Kolawa, S. Raud, and M. A. Nicolet, Appl. Surf. Sci. 53, 364 (1991).
-
(1991)
Appl. Surf. Sci.
, vol.53
, pp. 364
-
-
Pokela, P.J.1
Kwok, C.K.2
Kolawa, E.3
Raud, S.4
Nicolet, M.A.5
-
6
-
-
0030235253
-
-
M. Uekubo, T. Oku, K. Nii, M. Murakami, K. Takahiro, S. Yamaguchi, T. Nakano, and T. Ohta, Thin Solid Films 286, 170 (1996).
-
(1996)
Thin Solid Films
, vol.286
, pp. 170
-
-
Uekubo, M.1
Oku, T.2
Nii, K.3
Murakami, M.4
Takahiro, K.5
Yamaguchi, S.6
Nakano, T.7
Ohta, T.8
-
8
-
-
0034429741
-
-
MRS Symposium Proceedings No. 612 (Materials Research Society, Pittsburgh)
-
R. G. Gordon, S. Barry, R. N. R. Broomhall-Dillard, V. A. Wagner, and Y. Wang, Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, MRS Symposium Proceedings No. 612 (Materials Research Society, Pittsburgh, 2000), pp. D9.12/1-D9.12/6.
-
(2000)
Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics
-
-
Gordon, R.G.1
Barry, S.2
Broomhall-Dillard, R.N.R.3
Wagner, V.A.4
Wang, Y.5
-
9
-
-
22644450444
-
-
J. E. Kelsey, C. Goldberg, G. Nuesca, G. Peterson, A. E. Kaloyeros, and B. Arkles, J. Vac. Sci. Technol. B 17, 1101 (1999).
-
(1999)
J. Vac. Sci. Technol. B
, vol.17
, pp. 1101
-
-
Kelsey, J.E.1
Goldberg, C.2
Nuesca, G.3
Peterson, G.4
Kaloyeros, A.E.5
Arkles, B.6
-
12
-
-
0032025346
-
-
C. Meunier, C. Monteil, C. Savall, F. Palmino, J. Weber, R. Berjoan, and J. Durand, Appl. Surf. Sci. 125, 313 (1998).
-
(1998)
Appl. Surf. Sci.
, vol.125
, pp. 313
-
-
Meunier, C.1
Monteil, C.2
Savall, C.3
Palmino, F.4
Weber, J.5
Berjoan, R.6
Durand, J.7
-
13
-
-
0001755310
-
-
M. H. Tsai, S. C. Sun, H. T. Chiu, and S. H. Chuang, Appl. Phys. Lett. 68, 1412 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 1412
-
-
Tsai, M.H.1
Sun, S.C.2
Chiu, H.T.3
Chuang, S.H.4
-
18
-
-
10644297463
-
-
S. Bocharov, Z. P. Zhang, T. P. Beebe, and A. V. Teplyakov, Thin Solid Films 471, 159 (2005).
-
(2005)
Thin Solid Films
, vol.471
, pp. 159
-
-
Bocharov, S.1
Zhang, Z.P.2
Beebe, T.P.3
Teplyakov, A.V.4
-
19
-
-
0037109181
-
-
E. R. Engbrecht, Y. M. Sun, S. Smith, K. Pfiefer, J. Bennett, J. M. White, and J. G. Ekerdt, Thin Solid Films 418, 145 (2002).
-
(2002)
Thin Solid Films
, vol.418
, pp. 145
-
-
Engbrecht, E.R.1
Sun, Y.M.2
Smith, S.3
Pfiefer, K.4
Bennett, J.5
White, J.M.6
Ekerdt, J.G.7
-
20
-
-
33747860967
-
-
K.-S. Kim, M.-S. Lee, S.-S. Yim, H.-M. Kim, and K.-B. Kim, Appl. Phys. Lett. 89, 081913 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 081913
-
-
Kim, K.-S.1
Lee, M.-S.2
Yim, S.-S.3
Kim, H.-M.4
Kim, K.-B.5
-
21
-
-
2042505699
-
-
S.-H. Kim, S. S. Oh, H.-M. Kim, D.-H. Kang, K.-B. Kim, W.-M. Li, S. Haukka, and M. Tuominen, J. Electrochem. Soc. 151, C272 (2004).
-
(2004)
J. Electrochem. Soc.
, vol.151
, pp. 272
-
-
Kim, S.-H.1
Oh, S.S.2
Kim, H.-M.3
Kang, D.-H.4
Kim, K.-B.5
Li, W.-M.6
Haukka, S.7
Tuominen, M.8
-
22
-
-
8744224365
-
-
O. J. Bchir, K. C. Kim, T. J. Anderson, V. Craciun, B. C. Brooks, and L. McElwee-White, J. Electrochem. Soc. 151, G697 (2004).
-
(2004)
J. Electrochem. Soc.
, vol.151
, pp. 697
-
-
Bchir, O.J.1
Kim, K.C.2
Anderson, T.J.3
Craciun, V.4
Brooks, B.C.5
McElwee-White, L.6
-
23
-
-
0037296976
-
-
O. J. Bchir, S. W. Johnston, A. C. Cuadra, T. J. Anderson, C. G. Ortiz, B. C. Brooks, D. H. Powell, and L. McElwee-White, J. Cryst. Growth 249, 262 (2003).
-
(2003)
J. Cryst. Growth
, vol.249
, pp. 262
-
-
Bchir, O.J.1
Johnston, S.W.2
Cuadra, A.C.3
Anderson, T.J.4
Ortiz, C.G.5
Brooks, B.C.6
Powell, D.H.7
McElwee-White, L.8
-
24
-
-
0142120417
-
-
O. J. Bchir, K. M. Green, M. S. Hlad, T. J. Anderson, B. C. Brooks, C. B. Wilder, D. H. Powell, and L. McElwee-White, J. Organomet. Chem. 684, 338 (2003).
-
(2003)
J. Organomet. Chem.
, vol.684
, pp. 338
-
-
Bchir, O.J.1
Green, K.M.2
Hlad, M.S.3
Anderson, T.J.4
Brooks, B.C.5
Wilder, C.B.6
Powell, D.H.7
McElwee-White, L.8
-
25
-
-
51849100342
-
-
H. M. Ajmera, A. T. Heitsch, O. J. Bchir, T. J. Anderson, L. L. Reitfort, and L. McElwee-White, J. Electrochem. Soc. 155, H829 (2008).
-
(2008)
J. Electrochem. Soc.
, vol.155
, pp. 829
-
-
Ajmera, H.M.1
Heitsch, A.T.2
Bchir, O.J.3
Anderson, T.J.4
Reitfort, L.L.5
McElwee-White, L.6
-
27
-
-
13444311929
-
-
C. J. Carmalt, A. C. Newport, S. A. O'Neill, I. P. Parkin, A. J. P. White, and D. J. Williams, Inorg. Chem. 44, 615 (2005).
-
(2005)
Inorg. Chem.
, vol.44
, pp. 615
-
-
Carmalt, C.J.1
Newport, A.C.2
O'Neill, S.A.3
Parkin, I.P.4
White, A.J.P.5
Williams, D.J.6
-
29
-
-
25144483043
-
-
A. Baunemann, D. Rische, A. Milanov, Y. Kim, M. Winter, C. Gemel, and R. A. Fischer, Dalton Trans. 2005, 3051.
-
Dalton Trans.
, vol.2005
, pp. 3051
-
-
Baunemann, A.1
Rische, D.2
Milanov, A.3
Kim, Y.4
Winter, M.5
Gemel, C.6
Fischer, R.A.7
-
30
-
-
33750420949
-
-
Y. S. Won, Y. S. Kim, T. J. Anderson, L. L. Reitfort, I. Ghiviriga, and L. McElwee-White, J. Am. Chem. Soc. 128, 13781 (2006).
-
(2006)
J. Am. Chem. Soc.
, vol.128
, pp. 13781
-
-
Won, Y.S.1
Kim, Y.S.2
Anderson, T.J.3
Reitfort, L.L.4
Ghiviriga, I.5
McElwee-White, L.6
-
31
-
-
30944462633
-
-
C. B. Wilder, L. L. Reitfort, K. A. Abboud, and L. McElwee-White, Inorg. Chem. 45, 263 (2006).
-
(2006)
Inorg. Chem.
, vol.45
, pp. 263
-
-
Wilder, C.B.1
Reitfort, L.L.2
Abboud, K.A.3
McElwee-White, L.4
-
32
-
-
0001475731
-
-
L. V. Interrante, G. A. Sigel, M. Garbauskas, C. Hejna, and G. A. Slack, Inorg. Chem. 28, 252 (1989).
-
(1989)
Inorg. Chem.
, vol.28
, pp. 252
-
-
Interrante, L.V.1
Sigel, G.A.2
Garbauskas, M.3
Hejna, C.4
Slack, G.A.5
-
33
-
-
33751158352
-
-
T. S. Lewkebandara, P. H. Sheridan, M. J. Heeg, A. L. Rheingold, and C. H. Winter, Inorg. Chem. 33, 5879 (1994).
-
(1994)
Inorg. Chem.
, vol.33
, pp. 5879
-
-
Lewkebandara, T.S.1
Sheridan, P.H.2
Heeg, M.J.3
Rheingold, A.L.4
Winter, C.H.5
-
34
-
-
0348046464
-
-
O. J. Bchir, K. M. Green, M. S. Hlad, T. J. Anderson, B. C. Brooks, and L. McElwee-White, J. Cryst. Growth 261, 280 (2004).
-
(2004)
J. Cryst. Growth
, vol.261
, pp. 280
-
-
Bchir, O.J.1
Green, K.M.2
Hlad, M.S.3
Anderson, T.J.4
Brooks, B.C.5
McElwee-White, L.6
-
41
-
-
33846786878
-
-
H. Nakazawa, T. Kawabata, M. Kudo, and M. Mashita, Appl. Surf. Sci. 253, 4188 (2007).
-
(2007)
Appl. Surf. Sci.
, vol.253
, pp. 4188
-
-
Nakazawa, H.1
Kawabata, T.2
Kudo, M.3
Mashita, M.4
-
43
-
-
0042193578
-
-
G. Leftheriotis, S. Papaefthimiou, P. Yianoulis, A. Siokou, and D. Kefalas, Appl. Surf. Sci. 218, 276 (2003).
-
(2003)
Appl. Surf. Sci.
, vol.218
, pp. 276
-
-
Leftheriotis, G.1
Papaefthimiou, S.2
Yianoulis, P.3
Siokou, A.4
Kefalas, D.5
-
47
-
-
0000860486
-
-
A. Katrib, F. Hemming, P. Wehrer, L. Hilaire, and G. Maire, J. Electron Spectrosc. Relat. Phenom. 76, 195 (1995).
-
(1995)
J. Electron Spectrosc. Relat. Phenom.
, vol.76
, pp. 195
-
-
Katrib, A.1
Hemming, F.2
Wehrer, P.3
Hilaire, L.4
Maire, G.5
-
48
-
-
0034272426
-
-
D. Gogova, K. Gesheva, A. Kakanakova-Georgieva, and M. Surtchev, Eur. Phys. J.: Appl. Phys. 11, 167 (2000).
-
(2000)
Eur. Phys. J.: Appl. Phys.
, vol.11
, pp. 167
-
-
Gogova, D.1
Gesheva, K.2
Kakanakova-Georgieva, A.3
Surtchev, M.4
|