Increasing output compaction in presence of unknowns using an X-canceling MISR with deterministic observation

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2008, Pages 35-42

  Garg, Ritesh ^a   Putman, Richard ^a,b   Touba, Nur A ^a  

^a The University of Texas at Austin   (United States)

^b Cirrus Logic   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT COVERAGE; OUTPUT RESPONSE; VLSI TESTS; X-MASKING;

COMPACTION;

EID: 51449106320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2008.42     Document Type: Conference Paper

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