SCOPUS 정보 검색 플랫폼

Journal of Physical Chemistry C

Volumn 112, Issue 29, 2008, Pages 10725-10729

Young's modulus and size-dependent mechanical quality factor of nanoelectromechanical germanium nanowire resonators

(4) Smith, Damon A a Holmberg, Vincent C a Lee, Doh C a,b Korgel, Brian A a

a The University of Texas at Austin (United States)

b LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC VOLTAGE; CONFIDENCE LIMITS; DECREASING DIAMETER; ELECTROMECHANICAL RESONANCE; MECHANICAL QUALITY; NANOELECTROMECHANICAL RESONATORS; SINGLE NANOWIRES; SIZE RANGES; SURFACE AREA-TO-VOLUME RATIOS; SURFACE LOSSES; TRANSMISSION ELECTRON MICROSCOPE; VIBRATIONAL AMPLITUDES; YOUNG'S MODULUS;

BANDPASS FILTERS; COPPER; ELASTIC MODULI; ELASTICITY; ELECTRIC WIRE; ENERGY DISSIPATION; FREQUENCY RESPONSE; GERMANIUM; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; OPTICAL DESIGN; PLATINUM; Q FACTOR MEASUREMENT; RESONATORS; TRANSMISSION ELECTRON MICROSCOPY;

NANOWIRES;

EID: 49149087324 PISSN: 19327447 EISSN: 19327455 Source Type: Journal
DOI: 10.1021/jp8010487 Document Type: Article

Times cited : (54)

References (56)

1
- 34547309547
- Lee, K.; Lukic, B.; Magrez, A.; Seo, J. W.; Briggs, G. A. D.; Kulik, A. J.; Forro, L. Nano Lett. 2007, 7, 1598-1602.
- (2007) Nano Lett , vol.7 , pp. 1598-1602
- Lee, K.¹ Lukic, B.² Magrez, A.³ Seo, J.W.⁴ Briggs, G.A.D.⁵ Kulik, A.J.⁶ Forro, L.⁷

2
- 0001491996
- Broughton, J. Q.; Meli, C. A. Phys. Rev. B 1997, 56, 611-618.
- (1997) Phys. Rev. B , vol.56 , pp. 611-618
- Broughton, J.Q.¹ Meli, C.A.²

3
- 0034276389
- Miller, R. E.; Shenoy, V. B. Nanotech. 2000, 11, 139-147.
- (2000) Nanotech , vol.11 , pp. 139-147
- Miller, R.E.¹ Shenoy, V.B.²

4
- 0037467961
- Sharma, P.; Ganti, S.; Bhate, N. Appl. Phys. Lett. 2003, 82, 535-537.
- (2003) Appl. Phys. Lett , vol.82 , pp. 535-537
- Sharma, P.¹ Ganti, S.² Bhate, N.³

5
- 34347330259
- Lee, B.; Rudd, R. E. Phys. Rev. B 2007, 75, 195328.
- (2007) Phys. Rev. B , vol.75 , pp. 195328
- Lee, B.¹ Rudd, R.E.²

6
- 0004264669
- McGraw-Hill Book Company, Inc, New York
- Herring, C. The Physics of Powder Metallurgy; McGraw-Hill Book Company, Inc.: New York, 1951.
- (1951) The Physics of Powder Metallurgy
- Herring, C.¹

7
- 0001406077
- Herring, C.; Gait, J. K. Phys. Rev. 1952, 85, 1060-1061.
- (1952) Phys. Rev , vol.85 , pp. 1060-1061
- Herring, C.¹ Gait, J.K.²

8
- 33847761435
- Davidson III, F. M.; Lee, D. C.; Fanfair, D. D.; Korgel, B. A. J. Phys. Chem. C 2007, 111, 2929-2935.
- (2007) J. Phys. Chem. C , vol.111 , pp. 2929-2935
- Davidson III, F.M.¹ Lee, D.C.² Fanfair, D.D.³ Korgel, B.A.⁴

9
- 0034712059
- Holmes, J. D.; Johnston, K. P.; Doty, R. C.; Korgel, B. A. Science 2000, 287, 1471-1473.
- (2000) Science , vol.287 , pp. 1471-1473
- Holmes, J.D.¹ Johnston, K.P.² Doty, R.C.³ Korgel, B.A.⁴

10
- 33745629865
- Korgel, B. A. Nat. Mater. 2006, 5, 521-522.
- (2006) Nat. Mater , vol.5 , pp. 521-522
- Korgel, B.A.¹

11
- 0037138651
- Hanrath, T.; Korgel, B. A. J. Am. Chem. Soc. 2002, 124, 1424-1429.
- (2002) J. Am. Chem. Soc , vol.124 , pp. 1424-1429
- Hanrath, T.¹ Korgel, B.A.²

12
- 0037418375
- Hanrath, T.; Korgel, B. A. Adv. Mater. 2003, 15, 437-440.
- (2003) Adv. Mater , vol.15 , pp. 437-440
- Hanrath, T.¹ Korgel, B.A.²

13
- 3442880423
- Shah, P. S.; Hanrath, T.; Johnston, K. P.; Korgel, B. A. J. Phys. Chem. B 2004, 108, 9574-9587.
- (2004) J. Phys. Chem. B , vol.108 , pp. 9574-9587
- Shah, P.S.¹ Hanrath, T.² Johnston, K.P.³ Korgel, B.A.⁴

14
- 4344682131
- Law, M.; Joshua, G.; Yang, P. Annu. Rev. Mater. Res. 2004, 34, 83-122.
- (2004) Annu. Rev. Mater. Res , vol.34 , pp. 83-122
- Law, M.¹ Joshua, G.² Yang, P.³

15
- 20544475443
- Ekinci, K. L.; Roukes, M. L. Rev. Sci. Instrum. 2005, 76, 061101.
- (2005) Rev. Sci. Instrum , vol.76 , pp. 061101
- Ekinci, K.L.¹ Roukes, M.L.²

16
- 0033525774
- Poncharal, P.; Wang, Z. L.; Ugarte, D.; de Heer, W. A. Science 1999, 283, 1513-1516.
- (1999) Science , vol.283 , pp. 1513-1516
- Poncharal, P.¹ Wang, Z.L.² Ugarte, D.³ de Heer, W.A.⁴

17
- 27544444670
- Lukic, B.; Seo, J. W.; Bacsa, R. R.; Delpeux, S.; Beguin, F.; Bister, G., Fonseca, A.; Nagy, J. B.; Kis, A.; Jeney, S.; Kulik, A. J.; Forro, L. Nano Lett. 2005, 5, 2074-2077.
- (2005) Nano Lett , vol.5 , pp. 2074-2077
- Lukic, B.¹ Seo, J.W.² Bacsa, R.R.³ Delpeux, S.⁴ Beguin, F.⁵ Bister, G.⁶ Fonseca, A.⁷ Nagy, J.B.⁸ Kis, A.⁹ Jeney, S.¹⁰ Kulik, A.J.¹¹ Forro, L.¹²

18
- 42749100529
- Cuenot, S.; Fretigny, C.; Demoustier-Champagne, S.; Nysten, B. Phys. Rev. B 2004, 69, 165410-165414.
- (2004) Phys. Rev. B , vol.69 , pp. 165410-165414
- Cuenot, S.¹ Fretigny, C.² Demoustier-Champagne, S.³ Nysten, B.⁴

19
- 33344464265
- Chen, C. Q.; Shi, Y.; Zhang, Y. S.; Zhu, J.; Yan, Y. J. Phys. Rev. Lett. 2006, 96, 075505.
- (2006) Phys. Rev. Lett , vol.96 , pp. 075505
- Chen, C.Q.¹ Shi, Y.² Zhang, Y.S.³ Zhu, J.⁴ Yan, Y.J.⁵

20
- 0242317277
- Li, X.; Ono, T.; Wang, Y.; Esashi, M. Appl. Phys. Lett. 2003, 83, 3081-3083.
- (2003) Appl. Phys. Lett , vol.83 , pp. 3081-3083
- Li, X.¹ Ono, T.² Wang, Y.³ Esashi, M.⁴

21
- 33644899451
- Nam, C.-Y.; Jaroenapibal, P.; Tham, D.; Luzzi, D. E.; Evoy, S.; Fischer, J. E. Nano Lett. 2006, 6, 153-158.
- (2006) Nano Lett , vol.6 , pp. 153-158
- Nam, C.-Y.¹ Jaroenapibal, P.² Tham, D.³ Luzzi, D.E.⁴ Evoy, S.⁵ Fischer, J.E.⁶

22
- 9744272434
- Nilsson, S. G.; Borrise, X.; Montelius, L. Appl. Phys. Lett. 2004, 85, 3555-3557.
- (2004) Appl. Phys. Lett , vol.85 , pp. 3555-3557
- Nilsson, S.G.¹ Borrise, X.² Montelius, L.³

23
- 0030800875
- Wong, E. W.; Sheehan, P. E.; Lieber, C. M. Science 1997, 277, 1971-1975.
- (1997) Science , vol.277 , pp. 1971-1975
- Wong, E.W.¹ Sheehan, P.E.² Lieber, C.M.³

24
- 21844473049
- Wu, B.; Heidelberg, A.; Boland, J. J. Nature 2005, 4, 525-529.
- (2005) Nature , vol.4 , pp. 525-529
- Wu, B.¹ Heidelberg, A.² Boland, J.J.³

25
- 33846353537
- Ngo, L. T.; Almecija, D.; Sader, J. E.; Daly, B.; Petkov, N.; Holmes, J. D.; Erts, D.; Boland, J. J. Nano Lett. 2006, 6, 2964-2968.
- (2006) Nano Lett , vol.6 , pp. 2964-2968
- Ngo, L.T.¹ Almecija, D.² Sader, J.E.³ Daly, B.⁴ Petkov, N.⁵ Holmes, J.D.⁶ Erts, D.⁷ Boland, J.J.⁸

26
- 33745758674
- Heidelberg, A.; Ngo, L. T.; Wu, B.; Phillips, M. A.; Sharma, S.; Kamins, T. I.; Sader, J. E.; Boland, J. J. Nano Lett. 2006, 6, 1101-1106.
- (2006) Nano Lett , vol.6 , pp. 1101-1106
- Heidelberg, A.¹ Ngo, L.T.² Wu, B.³ Phillips, M.A.⁴ Sharma, S.⁵ Kamins, T.I.⁶ Sader, J.E.⁷ Boland, J.J.⁸

27
- 33646389840
- Hoffmann, S.; Utke, I.; Moser, B.; Michler, J.; Christiansen, S. H.; Schmidt, V.; Senz, S.; Werner, P.; Gosele, U.; Ballif, C. Nano Lett. 2006, 6, 622-625.
- (2006) Nano Lett , vol.6 , pp. 622-625
- Hoffmann, S.¹ Utke, I.² Moser, B.³ Michler, J.⁴ Christiansen, S.H.⁵ Schmidt, V.⁶ Senz, S.⁷ Werner, P.⁸ Gosele, U.⁹ Ballif, C.¹⁰

28
- 0041875716
- Salvetat, J.-P.; Briggs, G. A. D.; Bonard, J.-M.; Bacsa, R. R.; Kulik, A. J.; Stockli, T.; Burnham, N. A.; Forro, L. Phys. Rev. Lett. 1999, 82, 944-947.
- (1999) Phys. Rev. Lett , vol.82 , pp. 944-947
- Salvetat, J.-P.¹ Briggs, G.A.D.² Bonard, J.-M.³ Bacsa, R.R.⁴ Kulik, A.J.⁵ Stockli, T.⁶ Burnham, N.A.⁷ Forro, L.⁸

29
- 0037246407
- Dikin, D. A.; Chen, X.; Ding, W.; Wagner, G.; Ruoff, R. S. J. Appl. Phys. 2003, 93, 226-230.
- (2003) J. Appl. Phys , vol.93 , pp. 226-230
- Dikin, D.A.¹ Chen, X.² Ding, W.³ Wagner, G.⁴ Ruoff, R.S.⁵

30
- 2442591812
- Chen, X.; Zhang, S.; Wagner, G. J.; Ding, W.; Ruoff, R. S. J. Appl. Phys. 2004, 95, 4823-4828.
- (2004) J. Appl. Phys , vol.95 , pp. 4823-4828
- Chen, X.¹ Zhang, S.² Wagner, G.J.³ Ding, W.⁴ Ruoff, R.S.⁵

31
- 4644252328
- Sazonanova, V.; Yalsh, Y.; Ustunel, H.; Roundy, D.; Arias, T. A.; McEuen, P. L. Nature 2004, 457, 284-287.
- (2004) Nature , vol.457 , pp. 284-287
- Sazonanova, V.¹ Yalsh, Y.² Ustunel, H.³ Roundy, D.⁴ Arias, T.A.⁵ McEuen, P.L.⁶

32
- 0042760419
- Carr, D. W.; Evoy, S.; Sekaric, L.; Craighead, H. G.; Parpia, J. M. Appl. Phys. Lett. 1999, 75, 920-922.
- (1999) Appl. Phys. Lett , vol.75 , pp. 920-922
- Carr, D.W.¹ Evoy, S.² Sekaric, L.³ Craighead, H.G.⁴ Parpia, J.M.⁵

33
- 33751555279
- Liu, K. H.; Wang, W. L.; Xu, Z.; Liao, L.; Bai, X. D.; Wang, E. G. Appl. Phys. Lett. 2006, 89, 221908.
- (2006) Appl. Phys. Lett , vol.89 , pp. 221908
- Liu, K.H.¹ Wang, W.L.² Xu, Z.³ Liao, L.⁴ Bai, X.D.⁵ Wang, E.G.⁶

34
- 33747881813
- Tan, E. P. S.; Lim, C. T. Compos. Sci. Technol. 2005, 66, 1102-1111.
- (2005) Compos. Sci. Technol , vol.66 , pp. 1102-1111
- Tan, E.P.S.¹ Lim, C.T.²

35
- 0003696581
- Wiley: New York
- Nayfeh, A. H.; Mook, D. T. Nonlinear Oscillations; Wiley: New York, 1979.
- (1979) Nonlinear Oscillations
- Nayfeh, A.H.¹ Mook, D.T.²

36
- 9644276649
- Hanrath, T.; Korgel, B. A. J. Am. Chem. Soc. 2004, 126, 15466-15472.
- (2004) J. Am. Chem. Soc , vol.126 , pp. 15466-15472
- Hanrath, T.¹ Korgel, B.A.²

37
- 49149089604
- Nanowires smaller than 50 nm in diameter are obtained in the synthesis; however, these nanowires were unable to withstand the force of pulling away the underlying carbon film and would break during this process and therefore were not studied
- Nanowires smaller than 50 nm in diameter are obtained in the synthesis; however, these nanowires were unable to withstand the force of pulling away the underlying carbon film and would break during this process and therefore were not studied.

38
- 0003649677
- The Macmillan Company: New York
- Meirovitch, L. Analytical Methods in Vibrations; The Macmillan Company: New York, 1967.
- (1967) Analytical Methods in Vibrations
- Meirovitch, L.¹

39
- 33846370413
- Borchi, E.; Gennaro, S. D.; Macii, R.; Zoli, M. J. Phys. D: Appl. Phys. 1988, 27, 1304-1305.
- (1988) J. Phys. D: Appl. Phys , vol.27 , pp. 1304-1305
- Borchi, E.¹ Gennaro, S.D.² Macii, R.³ Zoli, M.⁴

40
- 34249014932
- McSkimin, H. J. J. Appl. Phys. 1953, 24, 988-997.
- (1953) J. Appl. Phys , vol.24 , pp. 988-997
- McSkimin, H.J.¹

41
- 36849141789
- Wortman, J. J.; Evans, R. A. J. Appl. Phys. 1965, 56, 153-156.
- (1965) J. Appl. Phys , vol.56 , pp. 153-156
- Wortman, J.J.¹ Evans, R.A.²

42
- 49149128035
- Some of the variation observed in E between samples might relate to a difference in nanowire growth direction. High resolution TEM could not be used to directly determine the growth direction of the nanowires after the cantilever was fabricated because the nanowire is not sufficiently stable under the electron beam for high resolution imaging. Statistical analysis of the nanowire growth directions in the sample showed that the majority of the wires used in the study had 〈110〉 growth directions, however, some of the nanowires in the sample exhibit 〈111〉 and 〈211〉 growth directions and it is possible that some of the cantilevers were constructed with nanowires with these other growth directions. Calculations of the Young's modulus have shown a difference of 17 GPa for the 〈110〉 and 〈111〉 crystal directions in bulk Ge.40
- 40

43
- 0003835723
- Hartcourt, Inc, Orlando, FL
- Fowles, G. R.; Cassiday, G. R. Analytical Mechanics; Hartcourt, Inc.: Orlando, FL, 1999.
- (1999) Analytical Mechanics
- Fowles, G.R.¹ Cassiday, G.R.²

44
- 0033892144
- Yasumura, K. Y.; Stowe, T. D.; Chow, E. M.; Pfafman, T.; Kenny, T. W.; Stipe, B. C.; Rugar, D. J. Microelectromech. S. 2000, 9, 117-125.
- (2000) J. Microelectromech. S , vol.9 , pp. 117-125
- Yasumura, K.Y.¹ Stowe, T.D.² Chow, E.M.³ Pfafman, T.⁴ Kenny, T.W.⁵ Stipe, B.C.⁶ Rugar, D.⁷

45
- 0036903107
- Yang, J.; Ono, T.; Esashi, M. J. Microelectromech. S. 2002, 11, 775-783.
- (2002) J. Microelectromech. S , vol.11 , pp. 775-783
- Yang, J.¹ Ono, T.² Esashi, M.³

46
- 1242285003
- Gaspar, J.; Chu, V.; Conde, J. P. Appl. Phys. Lett. 2004, 84, 622-624.
- (2004) Appl. Phys. Lett , vol.84 , pp. 622-624
- Gaspar, J.¹ Chu, V.² Conde, J.P.³

47
- 34547585788
- Feng, X. L.; Rongrui, H.; Yang, P.; Roukes, M. L. Nano Lett. 2007, 7, 1953-1959.
- (2007) Nano Lett , vol.7 , pp. 1953-1959
- Feng, X.L.¹ Rongrui, H.² Yang, P.³ Roukes, M.L.⁴

48
- 34548502693
- Cimalla, V.; Niebelschutz, F.; Tonisch, K.; Foerster, C.; Brueckner, K.; Cimalla, I.; Friedrich, T.; Pezoldt, J.; Stephan, R.; Hein, M.; Ambacher, O. Sens. Actuators, B 2007, 126, 24-34.
- (2007) Sens. Actuators, B , vol.126 , pp. 24-34
- Cimalla, V.¹ Niebelschutz, F.² Tonisch, K.³ Foerster, C.⁴ Brueckner, K.⁵ Cimalla, I.⁶ Friedrich, T.⁷ Pezoldt, J.⁸ Stephan, R.⁹ Hein, M.¹⁰ Ambacher, O.¹¹

49
- 0003168583
- Zener, C. Phys. Rev. 1938, 53, 90-99.
- (1938) Phys. Rev , vol.53 , pp. 90-99
- Zener, C.¹

50
- 37049017575
- Ibach, H. J. Vac. Sci. Technol. A 1994, 12, 2240-2245.
- (1994) J. Vac. Sci. Technol. A , vol.12 , pp. 2240-2245
- Ibach, H.¹

51
- 0000435875
- Yang, J.; Ono, T.; Esashi, M. Appl. Phys. Lett. 2000, 77, 3860-3862.
- (2000) Appl. Phys. Lett , vol.77 , pp. 3860-3862
- Yang, J.¹ Ono, T.² Esashi, M.³

52
- 12844273739
- Wang, Y.; Henry, J. A.; Debodhonyaa, S.; Hines, M. A. Appl. Phys. Lett. 2004, 85, 5736-5738.
- (2004) Appl. Phys. Lett , vol.85 , pp. 5736-5738
- Wang, Y.¹ Henry, J.A.² Debodhonyaa, S.³ Hines, M.A.⁴

53
- 17144410348
- Hanrath, T.; Korgel, B. A. J. Phys. Chem. B 2005, 709, 5518-5524.
- (2005) J. Phys. Chem. B , vol.709 , pp. 5518-5524
- Hanrath, T.¹ Korgel, B.A.²

54
- 24644476201
- Hanrath, T.; Korgel, B. A. Small 2005, 1, 717-721.
- (2005) Small , vol.1 , pp. 717-721
- Hanrath, T.¹ Korgel, B.A.²

55
- 49149087995
- 47 state that their Si nanowires had 〈111〉 growth directions and faceted {112} surfaces
- 47 state that their Si nanowires had 〈111〉 growth directions and faceted {112} surfaces. The Ge nanowires studied here have predominantly 〈110〉 growth directions, which have predominantly {111) and {100} faceted surfaces.
- The Ge nanowires studied here have predominantly 〈110〉 growth directions, which have predominantly {111) and {100} faceted surfaces
- Feng¹

56
- 49149115836
- An additional requirement for using the Euler-Bernoulli model to calculate the Young's modulus, is to distinguish the fundamental resonance frequency from other higher-order vibrational modes. Forced resonance occurs at ω, ω0 and ω, ω0/2, while parametric resonance occurs at ω, ω0/n, where ω is the angular frequency of the applied voltage ω, 2πf, ω0 is the natural angular resonance frequency of the nanowire, and n is an integer greater than one.34 By applying the potential with the counterelectrode transverse to the nanowire, where forced excitation is dominant,18,31 the natural resonance frequency was determined
- 18,31 the natural resonance frequency was determined.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.