Measurement of mechanical resonance and losses in nanometer scale silicon wires

Applied Physics Letters

Volumn 75, Issue 7, 1999, Pages 920-922

  Carr, Dustin W ^a   Evoy, S ^a   Sekaric, L ^a   Craighead, H G ^a   Parpia, J M ^a  

^a Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042760419     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124554     Document Type: Article

References (16)

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