A generalized description of the elastic properties of nanowires

Nano Letters

Volumn 6, Issue 6, 2006, Pages 1101-1106

  Heidelberg, Andreas ^a   Ngo, Lien T ^a   Wu, Bin ^a   Phillips, Mick A ^a   Sharma, Shashank ^b   Kamins, Theodore I ^b   Sader, John E ^c   Boland, John J ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b HEWLETT PACKARD LABORATORIES   (United States)

^c UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE FRACTURE; INHERENT NONLINEARITY; NANOWIRE (NW);

DEFORMATION; ELASTICITY; GOLD;

NANOSTRUCTURED MATERIALS;

NANOTUBE;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; ELASTICITY; ELECTRICITY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; MECHANICAL STRESS; METHODOLOGY; NANOTECHNOLOGY; NONLINEAR SYSTEM; ULTRASTRUCTURE;

COMPUTER-AIDED DESIGN; ELASTICITY; ELECTRIC WIRING; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; NANOTECHNOLOGY; NANOTUBES; NONLINEAR DYNAMICS; STRESS, MECHANICAL;

EID: 33745758674     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl060028u     Document Type: Article

References (25)

1. Yu, M.-F.; Lourie, O.; Dyer, M. J.; Moloni, K.; Kelly, T. F.; Ruoff, R. S. Science 2000, 287, 637-640.
2. Yu, M.-F.; Files, B. S.; Arepalli, S.; Ruoff, R. S. Phys. Rev. Lett. 2000, 84, 5552-5555.
3. Krishnan, A.; Dujardin, E.; Ebbesen, T. W.; Yianilos, P. N.; Treacy, M. M. J. Phys. Rev. B 1998, 58, 14013-14019.
4. Poncharal, P.; Wang, Z.-L.; Ugarte, D.; de Heer, W. A. Science 1999, 283, 1513-1516.
5. Chopra, N. G.; Zettl, A. Solid State Commun. 1998, 105, 297-300.
6. Wong, E.-W.; Sheehan, P. E.; Lieber C. M. Science 1997, 277, 1971-1975.
7. Kis, A.; Kasas, S.; Babic, B.; Kulik, A. J.; Benoit, W.; Briggs, G. A. D.; Schonenberger, C.; Catsicas, S.; Forro, L. Phys. Rev. Lett. 2002, 89, 248101.
8. Kis, A.; Mihailovic, D.; Remskar, M.; Mrzel, A.; Jesih, A.; Piwonski, I.; Kulik, A. J.; Benoit, W.; Forro, L. Adv. Mater. 2003, 15, 733-736.
9. Salvetat, J.-P.; Kulik, A. J.; Bonard, J. M.; Briggs, G. A. D.; Stockli, T.; Metenier, K.; Bonnamy, S.; Beguin, F.; Burnham, N. A.; Forro, L. Adv. Mater. 1999, 11, 161-165.
10. Salvetat, J.-P.; Bonard, J. M.; Thomson, N. H.; Kulik, A. J.; Forro, L.; Benoit, W.; Zuppiroli, L. Appl. Phys. A 1999, 69, 255-260.
11. Wu, B.; Heidelberg, A.; Boland, J. J. Nat. Mater. 2005, 4, 525-529.
12. Namazu, T.; Isono, Y.; Tanaka, T. J. Microelectromech. Syst. 2000, 9, 450-459.
13. Sundararajan, S.; Bushan, B.; Namazu, T.; Isono, Y. Ultramicroscopy 2002, 91, 111-118.
14. Salvetat, J.-P.; Briggs, G. A. D.; Bonard, J. M.; Bacas, R. R.; Kulik, A. J.; Stockli, T.; Burnham, N. A.; Forro, L. Phys. Rev. Lett. 1999, 82, 944-47.
15. Walters, D. A.; Ericson, L. M.; Casavant, M. J.; Liu, J.; Colbert, D. T.; Smith, K. A.; Smalley, R. E. Appl. Phys. Lett. 1999, 74, 3803-05.
16. Tombler, T. W.; Zhou, C.-W.; Alexseyev, L.; Kong, J.; Dai, H.-J.; Lei, L.; Jayanthi, C. S.; Tang, M.-J.; Wu, S.-Y. Nature 2000, 405, 769-72.
17. Minot, E. D.; Yaish, Y.; Sazonova, V.; Park J. Y.; Brink, M.; McEuen, P. L. Phys. Rev. Lett. 2003, 90, 156401.
18. Bellan, L. M.; Kameoka, J.; Craighead, H. G. Nanotechnology 2005, 16, 1095-1099.
19. Sharma S.; Kamins, T. I.; Williams, R. S. Appl. Phys. A: Mater. Sci. Process. 2005, 80, 1225-29.
20. Masuda, H.; Fukuda, K. Science 1995, 268, 1466-68.
21. Landau, L. D.; Lifshitz, E. M. Theory of Elasticity; Pergamon: Oxford, 1970.
22. This analysis is valid when the spanning length of the nanowire over the trench is much larger than its diameter. Experimentally, the trench width is restricted since very wide trenches cause the nanowires to droop. For aspect ratios of 10-20 (typical for our experiments), we found these equations to be valid. Au nanowires with very large length-to-diameter ratios (> 20) can be pushed more than one diameter before they yield, and F-d curves of these nanowires show nonlinear behavior before onset of inelastic deformation. For the Au nanowires studied here, this onset is obvious, but for materials that yield less dramatically or for wire configurations that have wide range of aspect ratios, this analysis may be exceptionally useful.
23. Wortman, J. J.; Evans, R. A. J. Appl. Phys. 1965, 36, 153-156.
24. Callister, W. D., Jr. Materials Science and Engineering; Wiley: New York, 1994.
25. Wu, B.; Heidelberg, A.; Boland, J. J.; Sader, J. E.; Sun, X.-M.; Li, Y.-D. Nano Lett. 2006, 6, 468-472.