A probabilistic method to determine the minimum leakage vector for combinational designs in the presence of random PVT variations

Integration, the VLSI Journal

Volumn 41, Issue 3, 2008, Pages 399-412

  Gulati, Kanupriya ^a   Jayakumar, Nikhil ^b   Khatri, Sunil P ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

PVT variations; Subthreshold leakage

Indexed keywords

ELECTRIC POWER UTILIZATION; LEAKAGE CURRENTS; SIGNAL ANALYSIS; VECTORS;

COMBINATIONAL DESIGNS; PVT VARIATIONS; SUBTHRESHOLD LEAKAGE;

PROBABILISTIC LOGICS;

EID: 43049168571     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vlsi.2007.10.001     Document Type: Article

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