Physical properties of (La,Sr)Ti(O,N)3 thin films grown by pulsed laser deposition

Materials Research Bulletin

Volumn 43, Issue 6, 2008, Pages 1376-1383

  Aguiar, Rosiana ^a   Logvinovich, Dmitry ^b   Weidenkaff, Anke ^b   Karl, Helmut ^a   Schneider, Christof W ^a   Reller, Armin ^a   Ebbinghaus, Stefan G ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

A. Thin films; B. Epitaxial growth; B. Laser deposition; D. Electrical properties

Indexed keywords

ELECTRIC PROPERTIES; EPITAXIAL GROWTH; FILM GROWTH; LANTHANUM COMPOUNDS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT;

CUBIC PEROVSKITE STRUCTURE;

THIN FILMS;

EID: 41349113782     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.06.049     Document Type: Article

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