메뉴 건너뛰기




Volumn 22, Issue 1, 2008, Pages 1-9

Advances in research and application of lead-free solders for electronic and photonic packaging

Author keywords

Electromigration; Electronic and photonic packaging; Lead free solders; Metallic materials; Reliability; Tin whisker

Indexed keywords

COPPER ALLOYS; DURABILITY; ELECTROMIGRATION; PACKAGING; RELIABILITY; SILVER ALLOYS; TIN ALLOYS; ZINC ALLOYS;

EID: 40949105148     PISSN: 10053093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (22)

References (47)
  • 3
    • 0032071864 scopus 로고    scopus 로고
    • Get the lead out
    • B. Trumble, Get the lead out!, IEEE Spectrum, 5, 55(1998)
    • (1998) IEEE Spectrum , vol.5 , pp. 55
    • Trumble, B.1
  • 4
    • 40949099672 scopus 로고
    • The composition optimization of solders based on the studies of surface-active behavior of microadding elements
    • ZHANG Xinping, WANG Hongwei, HUA Zigui, The composition optimization of solders based on the studies of surface-active behavior of microadding elements, Journal of Xi' an Jiaotong University, 28(4), 14(1994)
    • (1994) Journal of Xi' an Jiaotong University , vol.28 , Issue.4 , pp. 14
    • Zhang, X.1    Wang, H.2    Hua, Z.3
  • 5
    • 3142659538 scopus 로고    scopus 로고
    • Influence of elements Bi, Ag and In on surface tension and processing performance of tin-lead based solders
    • X.P. Zhang, H.W. Wang, Y.W. Shi, Influence of elements Bi, Ag and In on surface tension and processing performance of tin-lead based solders, J. Mater. Sci-Mater. EL, 15, 511(2004)
    • (2004) J. Mater. Sci-Mater. EL , vol.15 , pp. 511
    • Zhang, X.P.1    Wang, H.W.2    Shi, Y.W.3
  • 7
    • 34247115108 scopus 로고    scopus 로고
    • Creep and fatigue behaviors of the lead-free Sn-Ag-Cu-Bi and Sn60Pb40 solder interconnections at elevated temperatures
    • X.P. Zhang, C.B. Yu, S. Shrestha, L. Dorn, Creep and fatigue behaviors of the lead-free Sn-Ag-Cu-Bi and Sn60Pb40 solder interconnections at elevated temperatures, J. Mater. Sci-Mater. EL., 18, 665(2007)
    • (2007) J. Mater. Sci-Mater. EL. , vol.18 , pp. 665
    • Zhang, X.P.1    Yu, C.B.2    Shrestha, S.3    Dorn, L.4
  • 9
    • 1242308824 scopus 로고    scopus 로고
    • Evaluation of selected Japanese lead-free consumer electronics
    • Y. Fukuda, P. Casey, M. Pecht, Evaluation of selected Japanese lead-free consumer electronics, Trans. Elec. Pack. Manufac., 26(4), 305(2003)
    • (2003) Trans. Elec. Pack. Manufac. , vol.26 , Issue.4 , pp. 305
    • Fukuda, Y.1    Casey, P.2    Pecht, M.3
  • 11
    • 10444234289 scopus 로고    scopus 로고
    • Creep and fatigue characterization of lead free 95.5Sn-3.8Ag-0.7Cu solder
    • Las Vegas, USA
    • J.H.L. Pang, B.S. Xiong, T.H. Low, Creep and fatigue characterization of lead free 95.5Sn-3.8Ag-0.7Cu solder, in: Proceedings of 54th ECTC, Vol.2, (Las Vegas, USA, 1-4 June 2004) p. 1333
    • (2004) Proceedings of 54th ECTC , vol.2 , pp. 1333
    • Pang, J.H.L.1    Xiong, B.S.2    Low, T.H.3
  • 12
    • 1542506863 scopus 로고    scopus 로고
    • Joint strength and interfacial microstructure between Sn-Ag-Cu and Sn-Zn-Bi solders and Cu substrate
    • A.H. Yanagawa, E. Ide, K.F. Kobayashi, Joint strength and interfacial microstructure between Sn-Ag-Cu and Sn-Zn-Bi solders and Cu substrate, Sci. Tech. Adv. Mater., 5, 267(2004)
    • (2004) Sci. Tech. Adv. Mater. , vol.5 , pp. 267
    • Yanagawa, A.H.1    Ide, E.2    Kobayashi, K.F.3
  • 13
    • 40949139019 scopus 로고    scopus 로고
    • Research on the SnAgCu lead free solder with minute amount rare earth elements
    • LI Bo, SHI Yaowu, XIA Zhidong, LEI Yongping, GUO Fu, Research on the SnAgCu lead free solder with minute amount rare earth elements, Electronics Process Technology, 25(5), 193(2004)
    • (2004) Electronics Process Technology , vol.25 , Issue.5 , pp. 193
    • Li, B.1    Shi, Y.2    Xia, Z.3    Lei, Y.4    Guo, F.5
  • 14
    • 0035493703 scopus 로고    scopus 로고
    • The current status of lead-free solder alloys
    • D. Suraski, K. Seelig, The current status of lead-free solder alloys, IEEE Trans. Elec. Pack. Manufac, 24(4): 244(2001)
    • (2001) IEEE Trans. Elec. Pack. Manufac , vol.24 , Issue.4 , pp. 244
    • Suraski, D.1    Seelig, K.2
  • 15
    • 6344278527 scopus 로고    scopus 로고
    • Microstructure and creep behaviour of eutectic SnAg and SnAgCu solders
    • S. Wiese, K.J. Wolter, Microstructure and creep behaviour of eutectic SnAg and SnAgCu solders, Microelectronics Reliability, 44(12), 1923(2004)
    • (2004) Microelectronics Reliability , vol.44 , Issue.12 , pp. 1923
    • Wiese, S.1    Wolter, K.J.2
  • 16
    • 34147194578 scopus 로고    scopus 로고
    • Creep-resistance performance of two lead-free solders and comparison with Sn60Pb40 solder
    • ZHANG Xinpin, YU Chuangbao, ZHANG Yupeng, ZHU min, Creep-resistance performance of two lead-free solders and comparison with Sn60Pb40 solder, Transactions of the China Welding Institution, 28(2), 1(2007)
    • (2007) Transactions of the China Welding Institution , vol.28 , Issue.2 , pp. 1
    • Zhang, X.1    Yu, C.2    Zhang, Y.3    Zhu, M.4
  • 17
    • 40949157265 scopus 로고    scopus 로고
    • Thermal creep and fracture behaviors of the lead-free Sn-Ag-Cu-Bi solder interconnections under different stress levels
    • In press
    • X.P. Zhang, L.M. Yin, C.B. Yu, Thermal creep and fracture behaviors of the lead-free Sn-Ag-Cu-Bi solder interconnections under different stress levels, J. Mater. Sci-Mater. EL., 2007 (in press, online on 30 June 2007)
    • (2007) J. Mater. Sci-Mater. EL.
    • Zhang, X.P.1    Yin, L.M.2    Yu, C.B.3
  • 20
    • 0037437278 scopus 로고    scopus 로고
    • Microstructure and tensile properties of Sn-9Zn-xAg lead-free solder alloys
    • J.M. Song, G.F. Lan, T.S. Lui, L.H. Chen, Microstructure and tensile properties of Sn-9Zn-xAg lead-free solder alloys, Scripta Materialia, 48, 1047(2003)
    • (2003) Scripta Materialia , vol.48 , pp. 1047
    • Song, J.M.1    Lan, G.F.2    Lui, T.S.3    Chen, L.H.4
  • 21
    • 33646750384 scopus 로고    scopus 로고
    • Influence of Bi, Ag on microstructure and properties of Sn-Zn lead-free solder
    • WU Wenyun, QIU Xiaoming, YIN Shiqiang, SUN Daqian, LI Minggao, Influence of Bi, Ag on microstructure and properties of Sn-Zn lead-free solder, The Chinese Journal of Nonferrous Metals, 16(1): 158(2006)
    • (2006) The Chinese Journal of Nonferrous Metals , vol.16 , Issue.1 , pp. 158
    • Wu, W.1    Qiu, X.2    Yin, S.3    Sun, D.4    Li, M.5
  • 22
    • 27944481964 scopus 로고    scopus 로고
    • Wetting properties of Sn-9Zn solder alloy with trace rare earth elements
    • YU Daquan, ZHAO Jie, WANG Lai, Wetting properties of Sn-9Zn solder alloy with trace rare earth elements, The Chinese Journal of Nonferrous Metals, 13(4), 1001(2003)
    • (2003) The Chinese Journal of Nonferrous Metals , vol.13 , Issue.4 , pp. 1001
    • Yu, D.1    Zhao, J.2    Wang, L.3
  • 23
    • 40949128859 scopus 로고    scopus 로고
    • Beijing, Publishing House of Electronics Industry
    • ZHANG Wendian, Applied Surface Mount Technology (Beijing, Publishing House of Electronics Industry, 2006) p.197
    • (2006) Applied Surface Mount Technology
    • Zhang, W.1
  • 27
    • 40949133521 scopus 로고    scopus 로고
    • Development of no-clean flux for lead-free solder
    • WANG Suli, LEI Yongping, XIA Zhiadong, SHI Yaowu, LI Xiaoyan, Development of no-clean flux for lead-free solder, Electronics Process Technology, 25(4): 147(2004)
    • (2004) Electronics Process Technology , vol.25 , Issue.4 , pp. 147
    • Wang, S.1    Lei, Y.2    Xia, Z.3    Shi, Y.4    Li, X.5
  • 28
    • 28544453331 scopus 로고    scopus 로고
    • Spontaneous whisker growth on lead-free solder finishes
    • K.N. Tu, J.C.M. Li, Spontaneous whisker growth on lead-free solder finishes, Mater. Sci. Eng., A409, 131(2005)
    • (2005) Mater. Sci. Eng. , vol.A409 , pp. 131
    • Tu, K.N.1    Li, J.C.M.2
  • 29
    • 33845383438 scopus 로고    scopus 로고
    • The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth
    • Y. Fukuda, M. Osterman, M. Pecht, The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth. Microelectronics Reliability, 47, 88(2007)
    • (2007) Microelectronics Reliability , vol.47 , pp. 88
    • Fukuda, Y.1    Osterman, M.2    Pecht, M.3
  • 30
    • 0038140902 scopus 로고    scopus 로고
    • Tin whisker observations on pure tin-plated ceramic chip capacitors
    • Navy Pier, Chicago, USA
    • J. Brusse, Tin whisker observations on pure tin-plated ceramic chip capacitors, AESF SUR/FIN Proceedings, (Navy Pier, Chicago, USA, 24-27 June, 2002) p.45-61
    • (2002) AESF SUR/FIN Proceedings , pp. 45-61
    • Brusse, J.1
  • 31
    • 0029379119 scopus 로고
    • A study of the initiation of the tomb-stoning effect on leadless chips
    • I.K. Huit, B. Ralph, A study of the initiation of the tomb-stoning effect on leadless chips, Int. J. Mach. Tool. Manufac., 35, 1251(1995)
    • (1995) Int. J. Mach. Tool. Manufac. , vol.35 , pp. 1251
    • Huit, I.K.1    Ralph, B.2
  • 32
    • 19944432174 scopus 로고    scopus 로고
    • Kirkendall void formation in eutectic SnPb solder joint on bare Cu and its effect on joint reliability
    • K. Zeng, R. Stierman, T.C. Chiu, D. Edwards, K. Ano, K.N. Tu, Kirkendall void formation in eutectic SnPb solder joint on bare Cu and its effect on joint reliability, J. Appl. Phys., 97, 024508(2005)
    • (2005) J. Appl. Phys. , vol.97 , pp. 024508
    • Zeng, K.1    Stierman, R.2    Chiu, T.C.3    Edwards, D.4    Ano, K.5    Tu, K.N.6
  • 34
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packing technology
    • K. Zeng, K.N. Tu, Six cases of reliability study of Pb-free solder joints in electronic packing technology, Mater. Sci. Eng., R38, 55 (2002)
    • (2002) Mater. Sci. Eng. , vol.R38 , pp. 55
    • Zeng, K.1    Tu, K.N.2
  • 35
    • 33845716823 scopus 로고    scopus 로고
    • Electromigration issues in lead-free solder joints
    • C. Chen, S.W. Liang, Electromigration issues in lead-free solder joints, J. Mater. Sci-Mater. EL., 18, 259(2007)
    • (2007) J. Mater. Sci-Mater. EL. , vol.18 , pp. 259
    • Chen, C.1    Liang, S.W.2
  • 36
    • 0035797072 scopus 로고    scopus 로고
    • Tin-lead (SnPb) solder reaction in flip chip technology
    • K.N. Tu, K. Zeng, Tin-lead (SnPb) solder reaction in flip chip technology, Mater. Sci. Eng., R34, 1(2001)
    • (2001) Mater. Sci. Eng. , vol.R34 , pp. 1
    • Tu, K.N.1    Zeng, K.2
  • 37
    • 0036648147 scopus 로고    scopus 로고
    • Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films
    • M. Li, F. Zhang, W.T. Chen, K. Zeng, K.N. Tu, H. Balkan, P. Elenius, Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films, J. Mater. Resear., 17, 1612(2001)
    • (2001) J. Mater. Resear. , vol.17 , pp. 1612
    • Li, M.1    Zhang, F.2    Chen, W.T.3    Zeng, K.4    Tu, K.N.5    Balkan, H.6    Elenius, P.7
  • 38
    • 33645151444 scopus 로고    scopus 로고
    • Effect of Cu diffusion through Ni on the interfacial reactions of Sn3.5Ag0.75Cu and SnPb solders with Au/Ni/Cu substrate during aging
    • H.T. Chen, C.Q. Wang, M.Y. Li, D.W. Tian, Effect of Cu diffusion through Ni on the interfacial reactions of Sn3.5Ag0.75Cu and SnPb solders with Au/Ni/Cu substrate during aging, Mater. Lett., 60, 1669(2006)
    • (2006) Mater. Lett. , vol.60 , pp. 1669
    • Chen, H.T.1    Wang, C.Q.2    Li, M.Y.3    Tian, D.W.4
  • 39
    • 33746253822 scopus 로고    scopus 로고
    • Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling
    • H.T. Chen, C.Q. Wang, M.Y. Li, Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling, Microelectronics Reliability, 46, 1348(2006)
    • (2006) Microelectronics Reliability , vol.46 , pp. 1348
    • Chen, H.T.1    Wang, C.Q.2    Li, M.Y.3
  • 40
    • 24644488440 scopus 로고    scopus 로고
    • Reliability of lead free SnAg solder bumps: Influence of electromigration and temperature
    • B. Ebersberger, R. Bauer, L. Alexa, Reliability of lead free SnAg solder bumps: Influence of electromigration and temperature, Proceedings of 2005 IEEE/ECTC, 2005, 1407-1415
    • (2005) Proceedings of 2005 IEEE/ECTC , pp. 1407-1415
    • Ebersberger, B.1    Bauer, R.2    Alexa, L.3
  • 41
    • 33845715988 scopus 로고    scopus 로고
    • Impact of the ROHS Directive on high-performance electronic systems. Part II: Key reliability issues preventing the implementation of lead-free solders
    • K.J. Puttlitz, G.T. Galyon, Impact of the ROHS Directive on high-performance electronic systems Part II: Key reliability issues preventing the implementation of lead-free solders, J. Mater. Sci-Mater. EL., 18347(2007)
    • (2007) J. Mater. Sci-Mater. EL. , pp. 18347
    • Puttlitz, K.J.1    Galyon, G.T.2
  • 42
    • 0041905257 scopus 로고    scopus 로고
    • Die attachment for-120°C to+20°C thermal cycling of microelectronics for future mars rovers - An overview
    • R.K. Kirschman, W.M. Sokolowski, E.A. Kolawa, Die attachment for-120°C to+20°C thermal cycling of microelectronics for future mars rovers-An overview, J. Electronic Packaging, 123, 105(2001)
    • (2001) J. Electronic Packaging , vol.123 , pp. 105
    • Kirschman, R.K.1    Sokolowski, W.W.2    Kolawa, E.A.3
  • 44
    • 85025220432 scopus 로고    scopus 로고
    • The future of microelectronics and photonics and the role of mechanics and materials
    • E. Suhir, The future of microelectronics and photonics and the role of mechanics and materials, J. Electronic Packaging, 120, 1(1998)
    • (1998) J. Electronic Packaging , vol.120 , pp. 1
    • Suhir, E.1
  • 47
    • 0036680628 scopus 로고    scopus 로고
    • Fluxless In-Sn bonding process at 140°C
    • C.C. Lee, S. Choe, Fluxless In-Sn bonding process at 140°C, Mater. Sci. Eng., A333(1-2), 45(2002)
    • (2002) Mater. Sci. Eng. , vol.A333 , Issue.1-2 , pp. 45
    • Lee, C.C.1    Choe, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.