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Volumn 28, Issue 2, 2007, Pages 1-4

Creep-resistant performance of two lead-free solders and comparison with Sn60Pb40 solder

Author keywords

Creep behavior; Intergranular fracture; Lead free solder; Mechanical properties; Transgranular fracture

Indexed keywords

CREEP RESISTANCE; FRACTURE; MECHANICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOLDERED JOINTS;

EID: 34147194578     PISSN: 0253360X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (10)
  • 1
    • 0004070609 scopus 로고    scopus 로고
    • Lead-free soldering-an analysis of the current status of lead-free soldering
    • UK Dept. Trade and Industry
    • Richards B P, Levoguer C L, Hunt C P, et al. Lead-free soldering-an analysis of the current status of lead-free soldering[R]. UK Dept. Trade and Industry, 1999: 1-80.
    • (1999) , pp. 1-80
    • Richards, B.P.1    Levoguer, C.L.2    Hunt, C.P.3
  • 2
    • 34147221205 scopus 로고    scopus 로고
    • WEEE and RoHS and trends in the environmental legislation in European union
    • Tokyo, Japan
    • O'Neill M. WEEE and RoHS and trends in the environmental legislation in European union[C]//Proceedings of EcoDesign, Tokyo, Japan, 2003: 5-9.
    • (2003) Proceedings of EcoDesign , pp. 5-9
    • O'Neill, M.1
  • 4
    • 0036809677 scopus 로고    scopus 로고
    • Study on the microstructure of a novel lead-free solder alloy SnAgCuRE and its soldered joints
    • Chen Z G, Shi Y W, Xia Z D, et al. Study on the microstructure of a novel lead-free solder alloy SnAgCuRE and its soldered joints[J]. Journal of Electronic Materials, 2002, 31(10): 1122-1128.
    • (2001) Journal of Electronic Materials , vol.31 , Issue.10 , pp. 1122-1128
    • Chen, Z.G.1    Shi, Y.W.2    Xia, Z.D.3
  • 5
    • 0036840248 scopus 로고    scopus 로고
    • Improvement of wettability and tensile property in Sn-Ag-RE lead-free solder alloy
    • Wang L, Yu D Q, Zhao J. Improvement of wettability and tensile property in Sn-Ag-RE lead-free solder alloy[J]. Materials Letters, 2002, 56(6): 1039-1042.
    • (2002) Materials Letters , vol.56 , Issue.6 , pp. 1039-1042
    • Wang, L.1    Yu, D.Q.2    Zhao, J.3
  • 6
    • 0037466815 scopus 로고    scopus 로고
    • Evaluation of creep behavior of near-eutectic Sn/Ag solders containing small amount of alloy additions
    • Guo F, Choi S, Subramanian K N, et al. Evaluation of creep behavior of near-eutectic Sn/Ag solders containing small amount of alloy additions[J]. Materials Science and Engineering, 2003, A351: 190-199.
    • (2003) Materials Science and Engineering , vol.A351 , pp. 190-199
    • Guo, F.1    Choi, S.2    Subramanian, K.N.3
  • 7
    • 33645751542 scopus 로고    scopus 로고
    • Thermal fatigue and creep fracture behaviors of a nanocomposite solder in microelectronic and optoelectronic packaging
    • Zhang X P, Lim C S H, Mai Y W, et al. Thermal fatigue and creep fracture behaviors of a nanocomposite solder in microelectronic and optoelectronic packaging[J]. Key Engineering Materials, 2006, 312: 237-242.
    • (2006) Key Engineering Materials , vol.312 , pp. 237-242
    • Zhang, X.P.1    Lim, C.S.H.2    Mai, Y.W.3
  • 8
    • 0037197326 scopus 로고    scopus 로고
    • Creep behaviour of lead free and lead containing solder materials at high homologous temperatures with regard to small solder volumes
    • Villain J, Brueller O S, Qasim T. Creep behaviour of lead free and lead containing solder materials at high homologous temperatures with regard to small solder volumes[J]. Sensors and Actuators A, 2002, 99: 194-197.
    • (2002) Sensors and Actuators A , vol.99 , pp. 194-197
    • Villain, J.1    Brueller, O.S.2    Qasim, T.3
  • 10
    • 3142659538 scopus 로고    scopus 로고
    • Influence of elements Bi, Ag and in on surface tension and processing performance of tin-lead based solders
    • Zhang X P, Wang H W, Shi Y W. Influence of elements Bi, Ag and in on surface tension and processing performance of tin-lead based solders[J]. Journal of Materials Science: Materials in Electronics, 2004, 15(8): 511-517.
    • (2004) Journal of Materials Science: Materials in Electronics , vol.15 , Issue.8 , pp. 511-517
    • Zhang, X.P.1    Wang, H.W.2    Shi, Y.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.