Nanoscale fluorescence microscopy using carbon nanotubes

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 14, Issue 1, 2008, Pages 206-216

  Mu, Chun ^a   Mangum, Benjamin D ^a   Xie, Changan ^a,b   Gerton, Jordan M ^a  

^a UNIVERSITY OF UTAH   (United States)

^b GEORGETOWN UNIVERSITY   (United States)

Author keywords

Atomic force microscopy (AFM); Carbon nanotubes; Fluorescence microscopy; Fluorescence quenching; Nanooptics; Near field optics

Indexed keywords

ATOMIC FORCE MICROSCOPY; FLUORESCENCE MICROSCOPY; IMAGE ANALYSIS; NANOPROBES; POLYSTYRENES;

FLUORESCENCE QUENCHING; NANOOPTICS; NEAR-FIELD OPTICS; SILICON PROBES;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 39449106591     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2007.912914     Document Type: Article

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