Correlated topographic and spectroscopic imaging beyond diffraction limit by atomic force microscopy metallic tip-enhanced near-field fluorescence lifetime microscopy

Review of Scientific Instruments

Volumn 74, Issue 7, 2003, Pages 3347-3355

  Hu, Dehong ^a   Micic, Miodrag ^a   Klymyshyn, Nicholas ^a   Suh, Yung Doug ^a   Lu, H Peter ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DIFFRACTION; FINITE ELEMENT METHOD; FLUORESCENCE; PERTURBATION TECHNIQUES; SPECTROSCOPIC ANALYSIS;

SPATIAL RESOLUTION;

IMAGING TECHNIQUES;

EID: 0043269379     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1581359     Document Type: Article

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