Single-wall carbon nanotube atomic force microscope probes

Applied Physics Letters

Volumn 80, Issue 11, 2002, Pages 2002-2004

  Snow, E S ^a   Campbell, P M ^a   Novak, J P ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BENDING RESPONSE; ELASTIC RESPONSE; INTERACTION FORCES; LONG NANOTUBE; SINGLE-WALL; SMALL CANTILEVERS; TEXTURED SURFACE;

ATOMIC FORCE MICROSCOPY; PROBES;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 79956008517     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1461073     Document Type: Article

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