A vector-based approach for power supply noise analysis in test compaction

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 517-526

  Wang, Jing ^a   Yue, Ziding ^a   Lu, Xiang ^a   Qiu, Wangqi ^a   Shi, Weiping ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY TESTS; POWER SUPPLY NOISE; VECTOR COMPACTION;

ALGORITHMS; ELECTRIC DELAY LINES; ERROR ANALYSIS; MATHEMATICAL MODELS; POWER SUPPLY CIRCUITS; VECTORS;

SPURIOUS SIGNAL NOISE;

EID: 33847133825     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584012     Document Type: Conference Paper

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