On modeling cross-talk faults

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2003, Pages 490-495

  Zachariah, Sujit T ^a   Chang, Yi Shing ^a   Kundu, Sandip ^a   Tirumurti, Chandra ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE CROSS-COUPLING; CIRCUIT MARGINALITY; DESIGN TECHNIQUE; INDUSTRIAL CIRCUITS; MODELING TECHNIQUE; NOVEL TECHNIQUES; PROCESS GEOMETRIES;

CROSSTALK; EXHIBITIONS; VLSI CIRCUITS;

DESIGN;

EID: 79955964455     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253657     Document Type: Conference Paper

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