A Case Study of IR-Drop in Structured At-Speed Testing

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1098-1104

  Saxena, Jayashree ^a   Butler, Kenneth M ^a   Jayaram, Vinay B ^a   Kundu, Subhendu ^a   Arvind, N V ^a   Sreeprakash, Pravin ^a   Hachinger, Manfred ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; ENERGY UTILIZATION; INFRARED RADIATION; STANDBY POWER SYSTEMS; SWITCHING CIRCUITS;

TOGGLE CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0142246860     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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