Analysis of mechanisms inducing damping in dynamic force microscopy: Surface viscoelastic behavior and stochastic resonance process

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 363-371

  Boisgard, R ^a   Aime J P ^a   Couturier, G ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

Dynamic force microscopy; Relaxation process; Stochastic resonance process

Indexed keywords

ATOMIC FORCE MICROSCOPY; DAMPING; ENERGY DISSIPATION; OSCILLATORS (MECHANICAL); RANDOM PROCESSES; RELAXATION PROCESSES; RESONANCE; STIFFNESS; VISCOELASTICITY;

DYNAMIC FORCE MICROSCOPY;

SURFACE PROPERTIES;

EID: 0037187254     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00951-5     Document Type: Conference Paper

References (24)