Modelling atomic scale manipulation with the non-contact atomic force microscope

Nanotechnology

Volumn 17, Issue 23, 2006, Pages 5866-5874

  Trevethan, T ^a   Watkins, M ^a   Kantorovich, L N ^b   Shluger, A L ^a   Polesel Maris, J ^c   Gauthier, S ^d  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c CSEM   (Switzerland)

^d CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; MAGNESIA; MATHEMATICAL MODELS; MONTE CARLO METHODS; POTENTIAL ENERGY; SURFACE PHENOMENA;

ATOMIC SCALE MANIPULATION; ATOMISTIC MODELLING; OSCILLATING CANTILEVERS;

NANOTECHNOLOGY;

EID: 33846106836     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/23/026     Document Type: Article

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