Spectroscopic characterization of Ni films on sub-10-nm silica layers: Thermal metamorphosis and chemical bonding

Surface Science

Volumn 601, Issue 2, 2007, Pages 362-375

  Lee, Pei Hsuan ^a   Chang, Che Chen ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Metal nanoparticles; Nanometer silica film; Scanning auger microscopy; Surface diffusion; Thermal chemistry; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; NICKEL COMPOUNDS; PHYSICAL PROPERTIES; SILICA; THERMAL EFFECTS;

METAL NANOPARTICLES; NANOMETER SILICA FILM; SURFACE DIFFUSION; THERMAL CHEMISTRY;

THIN FILMS;

EID: 33846056465     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.10.030     Document Type: Article

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