Preparation and optical characterization of Au/SiO2 composite films with multilayer structure

Journal of Applied Physics

Volumn 93, Issue 8, 2003, Pages 4485-4488

  Liao, H B ^a,b   Wen, Weijia ^a   Wong, G K L ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b BEIJING NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; FILMS; GOLD; MULTILAYERS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

OPTICAL CHARACTERIZATION;

SILICA;

EID: 0037666194     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1560569     Document Type: Article

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