Parametric yield analysis and constrained-based supply voltage optimization

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2005, Pages 284-290

  Rao, Rahul ^a   Agarwal, Kanak ^a   Devgan, Anirudh ^a   Nowka, Kevin ^c   Sylvester, Dennis ^c   Brown, Richard ^b  

^a University of Michigan   (United States)

^b Department of Electrical and Computer Engineering   (United States)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY CONSTRAINT; INDUSTRY PROCESS; MATHEMATICAL FRAMEWORKS; PARAMETRIC YIELD; POWER CONSTRAINTS; PROCESS VARIATION; YIELD ESTIMATION; YIELD MAXIMIZATION;

FREQUENCY ESTIMATION; MONTE CARLO METHODS;

CONSTRAINED OPTIMIZATION;

EID: 84886705903     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2005.90     Document Type: Conference Paper

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