Statistical optimization of leakage power considering process variations using Dual-Vth and sizing

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 773-778

  Srivastava, Ashish ^a   Sylvester, Dennis ^a   Blaauw, David ^a  

^a University of Michigan   (United States)

Author keywords

Leakage; Optimization; Variability

Indexed keywords

ALGORITHMS; CONSTRAINT THEORY; LEAKAGE CURRENTS; MATHEMATICAL MODELS; OPTIMIZATION; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS;

LEAKAGE POWER; ROBUSTNESS ANALYSIS; STATISTICAL OPTIMIZATION; VARIABILITY;

CMOS INTEGRATED CIRCUITS;

EID: 4444277442     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996775     Document Type: Conference Paper

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