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Volumn 83, Issue 11-12, 2006, Pages 2543-2550
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A maskless wet etching silicon dioxide post-CMOS process and its application
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Author keywords
CMOS; Microstructures; Post process
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Indexed keywords
ETCHING;
INSERTION LOSSES;
MICROMACHINING;
MICROSTRUCTURE;
SILICA;
ISOLATION;
MICROROTORS;
RADIO FREQUENCY (RF) SWITCHES;
WET ETCHING;
CMOS INTEGRATED CIRCUITS;
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EID: 33751220249
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2006.06.006 Document Type: Article |
Times cited : (39)
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References (27)
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