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Volumn 25, Issue 1, 2000, Pages 35-41

Gas-phase xenon difluoride etching of microsystems fabricated through the Mitel 1.5-μm CMOS process

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ETCHING; FLUORINE COMPOUNDS; INTEGRATED CIRCUIT MANUFACTURE; MICROACTUATORS; MICROSENSORS; PIEZOELECTRIC TRANSDUCERS; XENON;

EID: 1642586684     PISSN: 08408688     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (19)
  • 1
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    • W. Riethmuller, U. Benecke, and U. Schnakenberg, "Development of commercial CMOS process based technologies for the fabrication of smart accelerometers," in Proc. Transducers '91, 1991, pp. 416-419.
    • (1991) Proc. Transducers '91 , pp. 416-419
    • Riethmuller, W.1    Benecke, U.2    Schnakenberg, U.3
  • 3
    • 0032141810 scopus 로고    scopus 로고
    • Micromachined thermally based CMOS microsensor
    • Aug.
    • H. Baltes, O. Paul, and O. Brand, "Micromachined thermally based CMOS microsensor," Proc. IEEE, vol. 86, no. 8, pp. 1660-1678, Aug. 1998.
    • (1998) Proc. IEEE , vol.86 , Issue.8 , pp. 1660-1678
    • Baltes, H.1    Paul, O.2    Brand, O.3
  • 6
    • 0033344355 scopus 로고    scopus 로고
    • Humidity measurement using resonating CMOS microcantilever strucures
    • D. Strembicke et al., "Humidity measurement using resonating CMOS microcantilever strucures," in Proc. 1999 IEEE Can. Conf. Elect. & Comp. Eng., 1999, pp. 1658-1661.
    • (1999) Proc. 1999 IEEE Can. Conf. Elect. & Comp. Eng. , pp. 1658-1661
    • Strembicke, D.1
  • 7
    • 1642635636 scopus 로고
    • Mitel 1.5 μm process review
    • Feb.
    • M. Faucher, "Mitel 1.5 μm process review," MITEL Semiconductor, Feb. 1994.
    • (1994) MITEL Semiconductor
    • Faucher, M.1
  • 9
    • 0027567658 scopus 로고
    • Mechanical stability and adhesion of microstructures under capillary forces - Part I: Basic theory
    • C.H. Mastrangelo and C.H. Hsu, "Mechanical stability and adhesion of microstructures under capillary forces - Part I: Basic theory," IEEE J. MEMS. vol. 2. no. 1, pp. 33-43.1993.
    • (1993) IEEE J. MEMS , vol.2 , Issue.1 , pp. 33-43
    • Mastrangelo, C.H.1    Hsu, C.H.2
  • 10
    • 0027565299 scopus 로고
    • Mechanical stability and adhesion of microstructures under capillary forces - Part II: Experiments
    • _, "Mechanical stability and adhesion of microstructures under capillary forces - Part II: Experiments," IEEE J. MEMS. vol. 2, no. 1, pp. 44-55, 1993.
    • (1993) IEEE J. MEMS , vol.2 , Issue.1 , pp. 44-55
  • 12
    • 0011197468 scopus 로고
    • 2: Doping and pressure effects
    • 2: Doping and pressure effects," J. AppL Phys., vol. 60. no. 9, pp. 3018-3027, 1986.
    • (1986) J. Appl. Phys. , vol.60 , Issue.9 , pp. 3018-3027
    • Houle, F.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.