SCOPUS 정보 검색 플랫폼

MRS Bulletin

Volumn 31, Issue 8, 2006, Pages 626-633

Silicon surface morphologies after femtosecond laser irradiation

(5) Tull, Brian R a Carey, James E a Mazur, Eric a McDonald, Joel P a Yalisove, Steven M a

a NONE

Author keywords

Laser ablation; Morphology; Oxide; Si

Indexed keywords

INTERFACES (MATERIALS); LASER ABLATION; LASER BEAM EFFECTS; LASER PULSES; MICROMETERS; MORPHOLOGY; OXIDES; SILICON; SINGLE CRYSTALS;

BLISTER FORMATION; FEMTOSECOND LASER PULSES; MICROFLUIDIC DEVICES;

SURFACE PROPERTIES;

EID: 33748320778 PISSN: 08837694 EISSN: None Source Type: Journal
DOI: 10.1557/mrs2006.160 Document Type: Article

Times cited : (188)

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