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Volumn 43, Issue 9, 2005, Pages 977-986

Femtosecond laser-induced damage morphologies of crystalline silicon by sub-threshold pulses

Author keywords

Femtosecond laser; Silicon; Sub threshold pulses; Surface damage morphologies

Indexed keywords

CONTINUOUS WAVE LASERS; CRYSTALLINE MATERIALS; DEFECTS; DOPING (ADDITIVES); HEAT AFFECTED ZONE; LASER ABLATION; PULSED LASER APPLICATIONS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 20344399931     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2004.10.006     Document Type: Article
Times cited : (50)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.