Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy

Journal of Applied Physics

Volumn 85, Issue 6, 1999, Pages 3301-3309

  Cavalleri, Andrea ^a   Sokolowski Tinten, Klaus ^b   Bialkowski, Joerg ^b   Schreiner, Michaela ^b   Von Der Linde, Dietrich ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001089205     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369675     Document Type: Article

References (45)

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