Analytical modeling and characterization of deep-submicrometer interconnect

Proceedings of the IEEE

Volumn 89, Issue 5, 2001, Pages 634-663

  Sylvester, Dennis ^a   Chenming, H U ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Capacitance measurement; Crosstalk; Inductance; Interconnections; Noise measurement; Ultralarge scale integration

Indexed keywords

EID: 33747574386     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.929648     Document Type: Article

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