Circuit sensitivity to interconnect variation

IEEE Transactions on Semiconductor Manufacturing

Volumn 11, Issue 4, 1998, Pages 557-568

  Lin, Zhihao ^a,d   Spanos, Costas J ^b,d   Milor, Linda S ^c,d   Lin, Y T ^c  

^a NeoParadigm Labs Inc   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c ADVANCED MICRO DEVICES   (United States)

^d IEEE   (United States)

Author keywords

Circuit analysis; Interconnect; Statistical analysis; Worst case design

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; MATHEMATICAL MODELS; OSCILLATORS (ELECTRONIC); SENSITIVITY ANALYSIS; STATISTICAL METHODS;

INTERCONNECT VARIATION; RING OSCILLATORS;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0032204374     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.728552     Document Type: Article

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