Lon-microbeam probe of high-speed shift registers for SEE analysis - Part I: SiGe

IEEE Transactions on Nuclear Science

Volumn 53, Issue 3, 2006, Pages 1574-1582

  Chu, P ^a   Hansen, D L ^a   Doyle, B L ^b   Jobe, K ^a   Lopez Aguado, R ^c   Shoga, M ^d   Walsh, D S ^b  

^a BOEING COMPANY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c RAYTHEON COMPANY   (United States)

^d NONE

Author keywords

Heavy ion; Microbeam; Silicon germanium; Single event upset

Indexed keywords

HEAVY ION; MICROBEAM; SILICON GERMANIUM; SINGLE EVENT UPSET;

BUFFER CIRCUITS; ELECTRIC NETWORK ANALYSIS; FLIP FLOP CIRCUITS; FUNCTIONS; PROBES; SENSITIVITY ANALYSIS;

SHIFT REGISTERS;

EID: 33746348939     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.861420     Document Type: Article

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