Critical charge for single-event transients (SETs) in bipolar linear circuits

IEEE Transactions on Nuclear Science

Volumn 48, Issue 6 I, 2001, Pages 1966-1972

  Pease, Ronald L ^a,b   Sternberg, Andrew ^c   Massengill, Lloyd ^a,c   Schrimpf, Ron ^a,c   Buchner, Stephen ^a,d,e   Savage, Mark ^a,f   Titus, Jeff ^a,f   Turflinger, Tom ^a,f  

^a IEEE   (United States)

^b RLP Research Inc   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d SFA INC   (United States)

^e NAVAL RESEARCH LABORATORY   (United States)

^f NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

Bipolar circuits; Heavy ion testing; Ion microbeam; Laser irradiation; Microcircuits; Operational amplifiers; Radiation effects; Single event effects (SEEs); Single event transients (SETs); SPICE current simulation; Voltage comparators

Indexed keywords

SINGLE-EVENT TRANSIENTS (SET);

BIPOLAR INTEGRATED CIRCUITS; ELECTRIC CHARGE; ENERGY TRANSFER; HEAVY IONS; LASER BEAM EFFECTS; LINEAR INTEGRATED CIRCUITS; NEUTRONS; OPERATIONAL AMPLIFIERS;

TRANSIENTS;

EID: 0035720528     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983158     Document Type: Conference Paper

References (14)

1. Observation of single event upsets in analog microcircuits
2. Observation of heavy ion induced transients in linear circuits
3. Heavy ion and proton induced single event transients in comparators
4. Single event effects in pulse width modulation controllers
5. Single event effects in analog and mixed-signal integrated circuits
6. Single event upset (SEU) sensitivity dependence of linear integrated circuits (IC's) on bias conditions
7. Single event transient SEU characterization of analog IC's for ESA's satellite
8. Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators
9. Analysis of single-event transients in analog circuits
10. A model for single-event transients in comparators
11. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies
12. Characterizing single-event transients in a voltage comparator (LM119)
13. Microbeam studies of single event effects