Microbeam mapping of single event latchups and single event upsets in CMOS SRAMs

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 pt 3, 1998, Pages 1595-1602

  Barak, J ^a   Adler, E ^a   Fischer, B E ^a   Schlogl, M ^a   Metzger, S ^a  

^a Soreq NRC Applied Physics Division   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC SURGES; INTEGRATED CIRCUIT MANUFACTURE; IONS; MATHEMATICAL TECHNIQUES; POWER SUPPLY CIRCUITS;

MICROBEAM MAPPING; SINGLE EVENT LATCHUPS; SINGLE EVENT UPSETS;

RANDOM ACCESS STORAGE;

EID: 0032095440     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685246     Document Type: Article

References (24)