Technique to measure an ion track profile

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2563-2570

  Musseau, O ^a,d   Ferlet Cavrois, V ^d   Campbell, A B ^b,c   Knudson, A R ^d   Buchner, S ^c   Fischer, B ^a   Schlogl M ^b  

^a CEA DIF   (France)

^b NAVAL RESEARCH LABORATORY   (United States)

^c SFA INC   (United States)

^d GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ION BEAMS; ION BOMBARDMENT; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICE TESTING;

ION TRACK STRUCTURES; RADIAL DENSITY DISTRIBUTION; SEMICONDUCTOR DETECTORS;

RADIATION DETECTORS;

EID: 0032320420     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736498     Document Type: Article

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