Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3163-3170

  Pease, Ronald L ^a   Sternberg, Andrew L ^b   Boulghassoul, Younes ^b   Massengill, Lloyd W ^b   Buchner, Stephen ^c   McMorrow, Dale ^d   Walsh, Dave S ^e   Hash, Gerald L ^e   LaLumondiere, Stephen D ^f   Moss, Steven C ^f  

^a RLP Research   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c QSS GROUP INC   (United States)

^d NAVAL RESEARCH LABORATORY   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

^f AEROSPACE CORPORATION   (United States)

Author keywords

Bipolar analog; Comparators; Integrated circuit; Ion beams; Ion microbeams; Ionization; Laser beams; Operational amplifiers; Radiation effects; Single event transient; Transient response

Indexed keywords

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; ELECTRIC POTENTIAL; ION BEAMS; IONIZATION; LASER PULSES; RADIATION EFFECTS; RADIATION HARDENING;

ION MICROBEAMS;

LINEAR NETWORKS;

EID: 0036952716     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805346     Document Type: Conference Paper

References (15)

1. R. Koga, S. D. Pinkerton, S. C. Moss, D. C. Mayer, S. LaLumondiere, S. J. Hansel, K. B. Crawford, and W. R. Crain, "Observation of single event upsets in analog microcircuits," IEEE Trans. Nucl. Sci., vol. 40, pp. 1838-1844, Dec. 1993.
2. R. Ecoffet, R. S. Duzellier, P. Tastet, C. Aicardi, and M. Labrunee, "Observation of heavy ion induced transients in linear circuits," 1994 IEEE Radiation Effects Data Workshop Record, pp. 72-77, 1994.
3. R. Koga, S. H. Crain, K. B. Crawford, S. D. LaLumondiere, and J. W. Howard, Jr., "Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators," 2000 IEEE Radiation Effects Data Workshop Record, pp. 53-60, 2000.
4. R. L. Pease, A. Sternberg, L. Massengill, R. Schrimpf, S. Buchner, M. Savage, J. Titus, and T. Turflinger, "Critical charge for single-event transients in bipolar linear circuits," IEEE Trans. Nucl. Sci., vol. 48, pp. 1966-1972, Dec. 2001.
5. Y. Boulghassoul, L. W. Massengill, A. L. Sternberg, R. L. Pease, S. P. Buchner, J. W. Howard, D. McMorrow, M. W. Savage, and C. Poivey, "Circuit modeling of fire LM124 operational amplifier for single-event-transient prediction," IEEE Trans. Nucl. Sci., vol. 49, pp. 3090-3096, Dec. 2002.
6. A. L. Sternberg, L. W. Massengill, Y. Boulghassoul, S. P. Buchner, R. L. Pease, and M. W. Savage, "The role of parasitic elements in the single-event-transient response of linear circuits," IEEE Trans. Nucl. Sci., vol. 49, pp. 3115-3120, Dec. 2002.
7. F. W. Sexton, "Microbeam studies of single event effects," IEEE Trans. Nucl. Sci., vol. 43, pp. 687-695, Apr. 1996.
8. J. S. Melinger, S. Buchner, D. McMorrow, W. J. Stapor, T. R. Weatherford, and A. B. Campbell, "Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies," IEEE Trans. Nucl. Sci., vol. 41, pp. 2574-2584, Dec. 1994.
9. S. D. LaLumondiere, S. C. Moss, R. Koga, and M. C. Maher, "Laser-induced and heavy ion-induced single event transient (SET) sensitivity measurements on LM139 comparators," IEEE Trans. Nucl. Sci., vol. 49, pp. 3121-3128, Dec. 2002.
10. D. McMorrow, W. T. Lotshaw, J. S. Melinger, S.. P. Buchner, and R. L. Pease, "Sub-bandgap laser induced single event effects: Carrier generation via two photon absorption," IEEE Trans. Nucl. Sci., vol. 49, pp. 3002-3008, Dec. 2002.
11. P. Adell, R. D. Schrimpf, H. J. Barnaby, R. Marec, C. Charty, P. Calvel, C. Barillot, and O. Mion, "Analysis of single-event transients in analog circuits," IEEE Trans. Nucl. Sci., vol. 47, pp. 2616-2623, Dec. 2000.
12. H. F. Barsun, NAVSEA Crane, personal communication, 2002.
13. S. C. Moss, S. D. LaLumondiere, J. R. Scarpulla, K. P. MacWilliams, W. R. Crain, and R. Koga, "Correlation of picosecond laser-Induced latchup and energetic particle-induced latchup in CMOS test structures," IEEE Trans. Nucl. Sci., vol. 42, p. 1948, Dec. 1995.
14. D. McMorrow, J. S. Milinger, S.Buchner Milinger, T. Scott, R. D. Brown, and N. F. Haddad, "Application of a pulsed laser for evaluation and optimization of SEU-hard designs," IEEE Trans. Nucl. Sci., vol. 47, p. 559, Dec. 2000.
15. J. S. Melinger, D. McMorrow, A. B. Campbell, S. Buchner, L. H. Tran, A. R. Knudson, and W. R. Curtice, "Pulsed laser induced single event upset and charge collection measurements as a function of optical penetration depth," J. Appl. Phys., vol. 84, p. 690, 1998.