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Volumn E82-C, Issue 6, 1999, Pages 955-965

Modeling and characterization of ultra deep submicron CMOS devices

Author keywords

Mos circuit model; Mosfet modeling

Indexed keywords


EID: 33746345338     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (31)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.