-
1
-
-
49949134400
-
Effects of diffusion current on characteristics of metal-oxide-semiconductor transistors
-
H. C. Pao and C. T. Sah, “Effects of diffusion current on characteristics of metal-oxide-semiconductor transistors,” Solid-State Electron., vol. 9, pp. 927-937, 1966.
-
(1966)
Solid-State Electron
, vol.9
, pp. 927-937
-
-
Pao, H.C.1
Sah, C.T.2
-
2
-
-
0020708861
-
Simplified long-channel MOSFET theory
-
R. F. Pierret and J. A. Shields, “Simplified long-channel MOSFET theory,” Solid-State Electron., vol. 26, pp. 143-147, 1983.
-
(1983)
Solid-State Electron
, vol.26
, pp. 143-147
-
-
Pierret, R.F.1
Shields, J.A.2
-
3
-
-
0009703767
-
Design theory of a surface field-effect transistor
-
H. K. Ihantola and J. L. Moll, “Design theory of a surface field-effect transistor,” Solid-State Electron., vol. 7, pp. 423-430, 1964.
-
(1964)
Solid-State Electron
, vol.7
, pp. 423-430
-
-
Ihantola, H.K.1
Moll, J.L.2
-
4
-
-
0017932965
-
A charge sheet model of the MOSFET
-
J. R. Brews, “A charge sheet model of the MOSFET,” Solid-State Electron., vol. 21, pp. 345-355, 1978.
-
(1978)
Solid-State Electron
, vol.21
, pp. 345-355
-
-
Brews, J.R.1
-
5
-
-
0020142951
-
Two-dimensional finite element charge sheet model of a short channel MOS transistor
-
C. L. Wilson and J. L. Blue, “Two-dimensional finite element charge sheet model of a short channel MOS transistor,” Solid-State Electron., vol. 25, pp. 461-477, 1982.
-
(1982)
Solid-State Electron
, vol.25
, pp. 461-477
-
-
Wilson, C.L.1
Blue, J.L.2
-
6
-
-
84937744575
-
Modeling and simulation of insulated-gate field-effect transistor switching circuits
-
H. Shichman and D. A. Hodges, “Modeling and simulation of insulated-gate field-effect transistor switching circuits,” IEEE J. Solid-State Circuits, vol. SC-3, pp. 285-289, 1968.
-
(1968)
IEEE J. Solid-State Circuits
, vol.SC-3
, pp. 285-289
-
-
Shichman, H.1
Hodges, D.A.2
-
7
-
-
0003915801
-
SPICE 2, A computer program to simulate semiconductor currents
-
L. W. Nagel, “SPICE 2, A computer program to simulate semiconductor currents,” Memo. ERL-M520, Univ. California, Berkeley, 1975.
-
(1975)
Memo. ERL-M520, Univ. California, Berkeley
-
-
Nagel, L.W.1
-
9
-
-
0020291970
-
Small-signal MOSFET models for analog circuit design
-
S. Liu and L. W. Nagel, “Small-signal MOSFET models for analog circuit design,” IEEE J. Solid-State Circuits, vol. SC-17, pp. 983-998, 1982.
-
(1982)
IEEE J. Solid-State Circuits
, vol.SC-17
, pp. 983-998
-
-
Liu, S.1
Nagel, L.W.2
-
10
-
-
0015346472
-
An accurate large-signal MOS transistor model for use in computer-aided design
-
G. Merckel, J. Borel, and N. Z. Cupcea, “An accurate large-signal MOS transistor model for use in computer-aided design,” IEEE Trans. Electron Devices, vol. ED-19, pp. 681-690, 1972.
-
(1972)
IEEE Trans. Electron Devices
, vol.ED-19
, pp. 681-690
-
-
Merckel, G.1
Borel, J.2
Cupcea, N.Z.3
-
11
-
-
0020192663
-
An accurate and simple MOSFET model for computer-aided design
-
H. I. Hanafi, L. H. Camnitz, and A. J. Dally, “An accurate and simple MOSFET model for computer-aided design,” IEEE J. Solid-State Circuits, vol. SC-17, pp. 882-891, 1982.
-
(1982)
IEEE J. Solid-State Circuits
, vol.SC-17
, pp. 882-891
-
-
Hanafi, H.I.1
Camnitz, L.H.2
Dally, A.J.3
-
12
-
-
0020191751
-
SPICE modeling for small geometry MOSFET circuits
-
P. Yang and P. K. Chatterjee, “SPICE modeling for small geometry MOSFET circuits,” IEEE Trans. Computer-Aided Design, vol. CAD-1, pp. 169-182, 1982.
-
(1982)
IEEE Trans. Computer-Aided Design
, vol.CAD-1
, pp. 169-182
-
-
Yang, P.1
Chatterjee, P.K.2
-
13
-
-
0021166538
-
An efficient MOS transistor model for computer-aided design
-
A. L. Silburt, R. C. Foss and W. F. Petrie, “An efficient MOS transistor model for computer-aided design,” IEEE Trans. Computer-Aided Design, vol. CAD-3, pp 104-111, 1984.
-
(1984)
IEEE Trans. Computer-Aided Design
, vol.CAD-3
, pp. 104-111
-
-
Silburt, A.L.1
Foss, R.C.2
Petrie, W.F.3
-
14
-
-
0023994571
-
Automated parameter extraction and modeling of the MOSFET below threshold
-
A. L. Silburt, A. R. Boothroyd, and M. Digiovanni, “Automated parameter extraction and modeling of the MOSFET below threshold,” IEEE Trans. Computer-Aided Design, vol. 7, pp. 484-488, 1988.
-
(1988)
IEEE Trans. Computer-Aided Design
, vol.7
, pp. 484-488
-
-
Silburt, A.L.1
Boothroyd, A.R.2
Digiovanni, M.3
-
16
-
-
84910283039
-
Modelling of insulated-gate field-effect transistors
-
Carleton Univ., Ottawa, Canada
-
Y. A. El-Mansy, “Modelling of insulated-gate field-effect transistors,” Ph.D. dissertation, Carleton Univ., Ottawa, Canada, 1974.
-
(1974)
Ph.D. dissertation
-
-
El-Mansy, Y.A.1
-
17
-
-
0017467244
-
A simple two-dimensional model of IGFET operation in the saturation region
-
Y. A. El-Mansy and A. R. Boothroyd, “A simple two-dimensional model of IGFET operation in the saturation region,” IEEE Trans. Electron Devices, vol. ED-24, pp. 241-253, 1977.
-
(1977)
IEEE Trans. Electron Devices
, vol.ED-24
, pp. 241-253
-
-
El-Mansy, Y.A.1
Boothroyd, A.R.2
-
18
-
-
84941533518
-
SCAMPER—Circuit design for the 1980s
-
D. Agnew, “SCAMPER—Circuit design for the 1980s,” Telesis, Bell Northern Res., vol. 3, pp. 3-9, 1980.
-
(1980)
Telesis, Bell Northern Res
, vol.3
, pp. 3-9
-
-
Agnew, D.1
-
19
-
-
0004005306
-
Physics of Semiconductor Devices
-
New York: Wiley
-
S. M. Sze, Physics of Semiconductor Devices. New York: Wiley, 1981, p. 367.
-
-
-
Sze, S.M.1
-
20
-
-
0009509593
-
Carrier mobilities in silicon empirically related to doping and field
-
D. M. Caughey and R. E. Thomas, “Carrier mobilities in silicon empirically related to doping and field,” Proc. IEEE, vol. 66, pp. 2192-2193, 1967.
-
(1967)
Proc. IEEE
, vol.66
, pp. 2192-2193
-
-
Caughey, D.M.1
Thomas, R.E.2
-
21
-
-
84941548191
-
-
unpublished work
-
Y. A. El-Mansy, unpublished work.
-
-
-
El-Mansy, Y.A.1
-
22
-
-
0018027059
-
A charge-oriented model for MOS transistor capacitances
-
D. E. Ward and R. W. Dutton, “A charge-oriented model for MOS transistor capacitances,” IEEE J. Solid-State Circuits, vol. SC-13, pp. 703-707, 1978.
-
(1978)
IEEE J. Solid-State Circuits
, vol.SC-13
, pp. 703-707
-
-
Ward, D.E.1
Dutton, R.W.2
-
23
-
-
0003751444
-
Charged-based modeling of capacitance in MOS transistors
-
June
-
D. E. Ward, “Charged-based modeling of capacitance in MOS transistors,” Tech. Rep. G201-11, Standford Electronics Lab., June 1981.
-
(1981)
Tech. Rep. G201-11
-
-
Ward, D.E.1
-
24
-
-
0020191751
-
SPICE modeling for small-geometry MOSFET circuits
-
P. Yang and P. K. Chatterjee, “SPICE modeling for small-geometry MOSFET circuits,” IEEE Trans. Computer-Aided Design, vol. CAD-1, pp. 169-182, 1982.
-
(1982)
IEEE Trans. Computer-Aided Design
, vol.CAD-1
, pp. 169-182
-
-
Yang, P.1
Chatterjee, P.K.2
-
25
-
-
84916364289
-
Models of Transistors and Diodes
-
New York: McGraw-Hill
-
J. G. Linvill, Models of Transistors and Diodes. New York: McGraw-Hill, 1963.
-
-
-
Linvill, J.G.1
-
26
-
-
0016113965
-
A simple theory to predict the threshold voltage of short-channel IGFETs
-
L. D. Yau, “A simple theory to predict the threshold voltage of short-channel IGFETs,” Solid-State Electron., vol. 17, pp. 1059-1063, 1974.
-
(1974)
Solid-State Electron
, vol.17
, pp. 1059-1063
-
-
Yau, L.D.1
-
28
-
-
84941470371
-
Transistor electrical characterization and analysis program (TECAP)
-
E. Khalily, “Transistor electrical characterization and analysis program (TECAP),” Hewlett-Packard J., vol. 32, no. 6, pp. 16-17, 1981.
-
(1981)
Hewlett-Packard J
, vol.32
, Issue.6
, pp. 16-17
-
-
Khalily, E.1
-
29
-
-
0022028916
-
A modification on ' ‘An improved method to determine MOSFET channel length
-
J. Whitfield, “A modification on ' ‘An improved method to determine MOSFET channel length’,” IEEE Electron Device Lett., vol. EDL-6, pp. 109-110, 1985.
-
(1985)
IEEE Electron Device Lett
, vol.EDL-6
, pp. 109-110
-
-
Whitfield, J.1
-
30
-
-
0020269014
-
A new method to electrically determine effective MOSFET channel width
-
Y.-R. Ma and K. L. Wang, “A new method to electrically determine effective MOSFET channel width,” IEEE Trans. Electron Devices, vol. ED-29, pp. 1825-1827, 1982.
-
(1982)
IEEE Trans. Electron Devices
, vol.ED-29
, pp. 1825-1827
-
-
Ma, Y.-R.1
Wang, K.L.2
-
31
-
-
0023364230
-
A capacitance method to determine the gate-to-drain/source overlap length of MOSFET'S
-
T. Y. Chan, A. T. Wu, P. K. Ko, and Chenming Hu, “A capacitance method to determine the gate-to-drain/source overlap length of MOSFET’s,” IEEE Electron Device Lett., vol. EDL-8, pp. 269-271, 1987.
-
(1987)
IEEE Electron Device Lett
, vol.EDL-8
, pp. 269-271
-
-
Chan, T.Y.1
Wu, A.T.2
Ko, P.K.3
Chenming Hu, C.4
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