Modelling and characterization of non-uniform substrate doping

Solid-State Electronics

Volumn 41, Issue 12, 1997, Pages 1857-1861

  Lallement, Christophe ^a   Bucher, Matthias ^a   Enz, Christian ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MODELS; SUBSTRATES; VOLTAGE MEASUREMENT;

THRESHOLD VOLTAGE; TWO DIMENSIONAL DEVICE SIMULATIONS;

SEMICONDUCTOR DOPING;

EID: 0031367226     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00137-8     Document Type: Article

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