Systematic control of the packing density of self-assembled monolayers using bidentate and tridentate chelating alkanethiols

Langmuir

Volumn 21, Issue 7, 2005, Pages 2902-2911

  Park, Joon Seo ^a   Vo, Andy Nguyen ^a   Barriet, David ^a,b   Shon, Young Seok ^a   Lee, T Randall ^a  

^a University of Houston   (United States)

^b WESTERN KENTUCKY UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANETHIOL; BIDENTATE; HUMAN SERUM ALBUMIN (HSA); PACKING DENSITY;

ADSORPTION; CONTACT ANGLE; DENSITY (SPECIFIC GRAVITY); ELLIPSOMETRY; GOLD; GONIOMETERS; MODULATION; PARAFFINS; POLARIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

SELF ASSEMBLY;

EID: 16244418739     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0475573     Document Type: Article

References (62)

1. Ulman, A. Chem. Rev. 1996, 96, 1533.
2. Ishida, T. In Chemistry of Nanomolecular Systems: Towards the Realization of Molecular Devices; Springer Series in Chemical Physics, Vol. 70; Springer: Berlin, 2003; p 91.
3. Chaki, N. K.; Vijayamohanan, K. Biosens. Bioelectron. 2002, 17, 1.
4. Choi, E. J.; Foster, M. D.; Daly, S.; Tilton, R.; Przybycien, T.; Majkrzak, C. F.; Witte, P.; Menzel, H. Langmuir 2003, 19, 5464.
5. Biomaterials Science: An Introduction to Materials in Medicine; Ratner, B. D., Hoffman, A. S., Schoen, F. J., Lemons, J. E., Eds.; Academic: San Diego, CA, 1996.
6. Wang, R. L. C.; Kreuzer, H. J.; Grunze, M. J. Phys. Chem. B 1997, 101, 9767.
7. Harder, P.; Grunze, M.; Dahint, R.; Whitesides, G. M.; Laibinis, P. E. J. Phys. Chem. B 1998, 102, 426.
8. Feldman, K.; Haehner, G.; Spencer, N. D.; Harder, P.; Grunze, M. J. Am. Chem. Soc. 1999, 121, 10134.
9. Pertsin, A. J.; Grunze, M.; Garbuzova, I. A. J. Phys. Chem. B 1998, 102, 4918.
10. Choi, E. J.; Foster, M. D. Langmuir 2002, 18, 557.
11. Lahann, J.; Mitragotri, S.; Tran, T.-N.; Kaido, H.; Sundaram, J.; Choi, I. S.; Hoffer, S.; Somorjai, G. A.; Langer, R. Science 2003, 299, 371.
12. Schoenfisch, M. H.; Pemberton, J. E. Langmuir 1999, 15, 509.
13. Bain, C. D.; Whitesides, G. M. Science 1988, 240, 62.
14. Bain, C. D.; Whitesides, G. M. J. Am. Chem. Soc. 1989, 111, 7164.
15. Bain, C. D.; Whitesides, G. M. Angew. Chem. 1989, 101, 522.
16. Chen, S.; Li, L.; Boozer, C. L.; Jiang, S. Langmuir 2000, 16, 9287.
17. Biebuyck, H. A.; Bain, C. D.; Whitesides, G. M. Langmuir 1994, 10, 1825.
18. Higashi, N.; Takahashi, M.; Niwa, M. Langmuir 1999, 15, 111.
19. Niwa, M.; Morikawa, M.-a.; Nabeta, T.; Higashi, N. Macromolecules 2002, 35, 2769.
20. Biebuyck, H. A.; Whitesides, G. M. Langmuir 1993, 9, 1766.
21. Troughton, E. B.; Bain, C. D.; Whitesides, G. M.; Nuzzo, R. G.; Allara, D. L.; Porter, M. D. Langmuir 1988, 4, 365.
22. Xu, S.; Cruchon-Dupeyrat, S. J. N.; Garno, J. C.; Liu, G.-Y.; Jennings, G. K.; Yong, T.-H.; Laibinis, P. E. J. Chem. Phys. 1998, 108, 5002.
23. Shon, Y.-S.; Colorado, R., Jr.; Williams, C. T.; Bain, C. D.; Lee, T. R. Lamgmuir 2000, 16, 541.
24. Lee, S.; Shon, Y.-S.; Colorado, R., Jr.; Guenard, R. L.; Lee, T. R.; Perry, S. S. Langmuir 2000, 16, 2220.
25. Shon, Y.-S.; Lee, S.; Colorado, R., Jr.; Perry, S. S.; Lee, T. R. J. Am. Chem. Soc. 2000, 122, 7556.
26. Shon, Y.-S.; Lee, T. R. J. Phys. Chem. B 2000, 104, 8192.
27. Shon, Y.-S.; Lee, S.; Perry, S. S.; Lee, T. R. J. Am. Chem. Soc. 2000, 122, 1278.
28. Park, J.-S.; Smith, A. C.; Lee, T. R. Langmuir 2004, 20, 5829.
29. Corey, E. J.; Suggs, J. W. Tetrahedron Lett. 1975, 2647.
30. Weibull, B.; Matell, M. Acta Chem. Scand 1962, 16, 1062.
31. Hu, J.; Mattern, D. L. J. Org. Chem. 2000, 65, 2277.
32. Shon, Y.-S.; Lee, T. R. J. Phys. Chem. B 2000, 104, 8182.
33. Strong, L.; Whitesides, G. M. Langmuir 1988, 4, 546.
34. Chidsey, C. E. D.; Liu, G. Y.; Rowntree, P.; Scoles, G. J. Chem. Phys. 1989, 91, 4421.
35. Recent work by grazing incidence X-ray diffraction suggests, however, that the sulfur headgroups dimerize in the form of surface-bound disulfides: Fenter, P.; Eberhardt, A.; Eisenberger, P. Science 1994, 226, 1216.
36. Molecular modeling was performed using AMI semiempirical calculations with PC Spartan Plus, Wave function, Irvine, CA.
37. Surface Analysis: The Principal Techniques; Vickerman, J. C., Ed.; Wiley: Chichester, 1997.
38. Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y. T.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152.
39. Castner, D. G.; Hinds, K.; Grainger, D. W. Langmuir 1996, 12, 5083.
40. Bain, C. D.; Troughton, E. B.; Tao, Y. T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem, Soc. 1989, 111, 321.
41. Carey, F. A.; Sundberg, R. J. Advanced Organic Chemistry, 3rd ed.; Plenum: New York, 1990.
42. The following values were used to calculate the theoretical slope: C-C = 1.545 Å, ∠CCC = 110.5°, C-S = 1.81 Å, C-H = 1.1 Å, and contribution from S = 1.5 Å.
43. Chaudhury, M. K. Mater. Sci. Eng., R 1996, R16, 97.
44. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
45. Ulman, A. An Introduction to Ultrathin Organic Films; Academic: Boston, 1991.
46. Characterization of Organic Thin Films; Ulman, A., Ed.; Butterworth-Heinemann: Boston, 1995.
47. Colorado, R., Jr.; Lee, T. R. J. Phys. Org. Chem. 2000, 13, 796.
48. Sheen, C. W.; Shi, J. X.; Maartensson, J.; Parikh, A. N.; Allara, D. L. J. Am. Chem. Soc. 1992, 114, 1514.
49. Snyder, R. G.; Hsu, S. L.; Krimm, S. Spectrochim. Acta 1978, 34A, 395.
50. MacPhail, R. A.; Strauss, H. L.; Snyder, R. G.; Elliger, C. A. J. Phys. Chem. 1984, 88, 334.
51. Snyder, R. G.; Strauss, H. L.; Elliger, C. A. J. Phys. Chem. 1982, 86, 5145.
52. Bensebaa, F.; Ellis, T. H.; Badia, A.; Lennox, R. B. J. Vac. Sci. Technol., A 1995, 13, 1331.
53. Bensebaa, F.; Ellis, T. H.; Badia, A.; Lennox, R. B. Langmuir 1998, 14, 2361.
54. Buffeteau, T.; Desbat, B.; Turlet, J. M. Appl. Spectrosc. 1991, 45, 380.
55. Buffeteau, T.; Desbat, B.; Blaudez, D.; Turlet, J. M. Appl. Spectrosc. 2000, 54, 1646.
56. Ishida, T.; Hara, M.; Kojima, I.; Tsuneda, S.; Nishida, N.; Sasabe, H.; Knoll, W. Langmuir 1998, 14, 2092.
57. Himmel, H. J.; Woell, C.; Gerlach, R.; Polanski, G.; Rubahn, H. G. Langmuir 1997, 13, 602.
58. Bain, C. D.; Whitesides, G. M. J. Phys. Chem. 1989, 93, 1670.
59. Colorado, R., Jr.; Lee, T. R. J. Phys. Chem. B 2003, 107, 10216.
60. We define the term "attenuation length" as the thickness of the monolayer film that is required to reduce the flux of the emitted photoelectrons by 1/e.
61. 2P intensities are attenuated by different overlayers for each of the different samples.
62. Jennings, G. K.; Laibinis, P. E. Langmuir 1996, 12, 6173.