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Surface and Interface Analysis

Volumn 31, Issue 11, 2001, Pages 1060-1067

Quantitative study of shear modulus and interfacial shear strength by combining modulated lateral force and magnetic force modulation microscopies

(2) Pietrement O a Troyon, M a

a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE (France)

Author keywords

AFM; Elastic properties; Friction; Lateral contact stiffness; Normal contact stiffness; Shear modulus; Shear strength; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; HIGH DENSITY POLYETHYLENES; LOW DENSITY POLYETHYLENES; SHEAR STRENGTH; STIFFNESS;

MAGNETIC FORCE MODULATION MICROSCOPY (MFMM); MODULATED LATERAL FORCE MICROSCOPY (MLFM);

ELASTIC MODULI;

EID: 0035506097 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1142 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.