-
2
-
-
0034205444
-
-
Cicero, R. L.; Linford, M. R.; Chidsey, C. E. D. Langmuir 2000, 16 (13), 5688-5695.
-
(2000)
Langmuir
, vol.16
, Issue.13
, pp. 5688-5695
-
-
Cicero, R.L.1
Linford, M.R.2
Chidsey, C.E.D.3
-
3
-
-
0345055314
-
-
Effenberger, F.; Gotz, G.; Bidlingmaier, B.; Wezstein, M. Angew. Chem., Int. Ed. 1998, 37 (18), 2462-2464.
-
(1998)
Angew. Chem., Int. Ed.
, vol.37
, Issue.18
, pp. 2462-2464
-
-
Effenberger, F.1
Gotz, G.2
Bidlingmaier, B.3
Wezstein, M.4
-
4
-
-
0001437602
-
-
Terry, J.; Linford, M. R.; Wigren, C.; Cao, R. Y.; Pianetta, P.; Chidsey, C. E. D. Appl. Phys. Lett. 1997, 71 (8), 1056-1058.
-
(1997)
Appl. Phys. Lett.
, vol.71
, Issue.8
, pp. 1056-1058
-
-
Terry, J.1
Linford, M.R.2
Wigren, C.3
Cao, R.Y.4
Pianetta, P.5
Chidsey, C.E.D.6
-
5
-
-
0031550028
-
-
Terry, J.; Mo, R.; Wigren, C.; Cao, R. Y.; Mount, G.; Pianetta, P.; Linford, M. R.; Chidsey, C. E. D. Nucl. Instrum. Methods Phys. Res., Sect. B: 1997, 133 (1-4), 94-101.
-
(1997)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.133
, Issue.1-4
, pp. 94-101
-
-
Terry, J.1
Mo, R.2
Wigren, C.3
Cao, R.Y.4
Mount, G.5
Pianetta, P.6
Linford, M.R.7
Chidsey, C.E.D.8
-
7
-
-
0029274673
-
-
Linford, M. R.; Fenter, P.; Eisenberger, P. M.; Chidsey, C. E. D. J. Am. Chem. Soc. 1995, 117 (11), 3145-3155.
-
(1995)
J. Am. Chem. Soc.
, vol.117
, Issue.11
, pp. 3145-3155
-
-
Linford, M.R.1
Fenter, P.2
Eisenberger, P.M.3
Chidsey, C.E.D.4
-
8
-
-
0001982327
-
-
Boukherroub, R.; Wayner, D. D. M.; Lockwood, D. J.; Canham, L. T. J. Electrochem. Soc. 2001, 148 (9), H91-H97.
-
(2001)
J. Electrochem. Soc.
, vol.148
, Issue.9
-
-
Boukherroub, R.1
Wayner, D.D.M.2
Lockwood, D.J.3
Canham, L.T.4
-
9
-
-
0011776778
-
-
Boukherroub, R.; Wayner, D. D. M.; Sproule, G. I.; Lockwood, D. J.; Canham, L. T. Nano Lett. 2001, 1 (12), 713-717.
-
(2001)
Nano Lett.
, vol.1
, Issue.12
, pp. 713-717
-
-
Boukherroub, R.1
Wayner, D.D.M.2
Sproule, G.I.3
Lockwood, D.J.4
Canham, L.T.5
-
10
-
-
0036476306
-
-
Boukherroub, R.; Wojtyk, J. T. C.; Wayner, D. D. M.; Lockwood, D. J. J. Electrochem. Soc. 2002, 149 (2), H59-H63.
-
(2002)
J. Electrochem. Soc.
, vol.149
, Issue.2
-
-
Boukherroub, R.1
Wojtyk, J.T.C.2
Wayner, D.D.M.3
Lockwood, D.J.4
-
11
-
-
0032021791
-
-
Sieval, A. B.; Demirel, A. L.; Nissink, J. W. M.; Linford, M. R.; van der Maas, J. H.; de Jeu, W. H.; Zuilhof, H.; Sudholter, E. J. R. Langmuir 1998, 14 (7), 1759-1768.
-
(1998)
Langmuir
, vol.14
, Issue.7
, pp. 1759-1768
-
-
Sieval, A.B.1
Demirel, A.L.2
Nissink, J.W.M.3
Linford, M.R.4
Van Der Maas, J.H.5
De Jeu, W.H.6
Zuilhof, H.7
Sudholter, E.J.R.8
-
12
-
-
0035799452
-
-
Sieval, A. B.; van den Hout, B.; Zuilhof, H.; Sudholter, E. J. R. Langmuir 2001, 17 (7), 2172-2181.
-
(2001)
Langmuir
, vol.17
, Issue.7
, pp. 2172-2181
-
-
Sieval, A.B.1
Van Den Hout, B.2
Zuilhof, H.3
Sudholter, E.J.R.4
-
13
-
-
0031276050
-
-
Sung, M. M.; Kluth, G. J.; Yauw, O. W.; Maboudian, R. Langmuir 1997, 13 (23), 6164-6168.
-
(1997)
Langmuir
, vol.13
, Issue.23
, pp. 6164-6168
-
-
Sung, M.M.1
Kluth, G.J.2
Yauw, O.W.3
Maboudian, R.4
-
14
-
-
0032675524
-
-
Boukherroub, R.; Morin, S.; Bensebaa, F.; Wayner, D. D. M. Langmuir 1999, 15 (11), 3831-3835.
-
(1999)
Langmuir
, vol.15
, Issue.11
, pp. 3831-3835
-
-
Boukherroub, R.1
Morin, S.2
Bensebaa, F.3
Wayner, D.D.M.4
-
16
-
-
0033573088
-
-
Buriak, J. M.; Stewart, M. P.; Geders, T. W.; Allen, M. J.; Choi, H. C.; Smith, J.; Raftery, D.; Canham, L. T. J. Am. Chem. Soc. 1999, 121 (49), 11491-11502.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, Issue.49
, pp. 11491-11502
-
-
Buriak, J.M.1
Stewart, M.P.2
Geders, T.W.3
Allen, M.J.4
Choi, H.C.5
Smith, J.6
Raftery, D.7
Canham, L.T.8
-
17
-
-
0037117863
-
-
Schmeltzer, J. M.; Porter, L. A.; Stewart, M. P.; Buriak, J. M. Langmuir 2002, 18 (8), 2971-2974.
-
(2002)
Langmuir
, vol.18
, Issue.8
, pp. 2971-2974
-
-
Schmeltzer, J.M.1
Porter, L.A.2
Stewart, M.P.3
Buriak, J.M.4
-
18
-
-
0031164080
-
-
Zazzera, L. A.; Evans, J. F.; Deruelle, M.; Tirrell, M.; Kessel, C. R.; McKeown, P. J. Electrochem. Soc. 1997, 144 (6), 2184-2189.
-
(1997)
J. Electrochem. Soc.
, vol.144
, Issue.6
, pp. 2184-2189
-
-
Zazzera, L.A.1
Evans, J.F.2
Deruelle, M.3
Tirrell, M.4
Kessel, C.R.5
McKeown, P.6
-
19
-
-
0033706011
-
-
Bateman, J. E.; Eagling, R. D.; Horrocks, B. R.; Houlton, A. J. Phys. Chem. B 2000, 104 (23), 5557-5565.
-
(2000)
J. Phys. Chem. B
, vol.104
, Issue.23
, pp. 5557-5565
-
-
Bateman, J.E.1
Eagling, R.D.2
Horrocks, B.R.3
Houlton, A.4
-
20
-
-
33748627964
-
-
Bateman, J. E.; Horrocks, B. R.; Houlton, A. J. Chem. Soc., Faraday Trans. 1997, 93 (14), 2427-2431.
-
(1997)
J. Chem. Soc., Faraday Trans.
, vol.93
, Issue.14
, pp. 2427-2431
-
-
Bateman, J.E.1
Horrocks, B.R.2
Houlton, A.3
-
21
-
-
0034320835
-
-
Haber, J. A.; Lauermann, I.; Michalak, D.; Vaid, T. P.; Lewis, N. S. J. Phys. Chem. B 2000, 104 (43), 9947-9950.
-
(2000)
J. Phys. Chem. B
, vol.104
, Issue.43
, pp. 9947-9950
-
-
Haber, J.A.1
Lauermann, I.2
Michalak, D.3
Vaid, T.P.4
Lewis, N.S.5
-
23
-
-
0346002581
-
-
Cleland, G.; Horrocks, B. R.; Houlton, A. J. Chem. Soc., Faraday Trans. 1995, 91 (21), 4001-4003.
-
(1995)
J. Chem. Soc., Faraday Trans.
, vol.91
, Issue.21
, pp. 4001-4003
-
-
Cleland, G.1
Horrocks, B.R.2
Houlton, A.3
-
24
-
-
0034271246
-
-
Boukherroub, R.; Morin, S.; Sharpe, P.; Wayner, D. D. M.; Allongue, P. Langmuir 2000, 16 (19), 7429-7434.
-
(2000)
Langmuir
, vol.16
, Issue.19
, pp. 7429-7434
-
-
Boukherroub, R.1
Morin, S.2
Sharpe, P.3
Wayner, D.D.M.4
Allongue, P.5
-
25
-
-
0029546382
-
-
Warntjes, M.; Vieillard, C.; Ozanam, F.; Chazalviel, J. N. J. Electrochem. Soc. 1995, 142 (12), 4138-4142.
-
(1995)
J. Electrochem. Soc.
, vol.142
, Issue.12
, pp. 4138-4142
-
-
Warntjes, M.1
Vieillard, C.2
Ozanam, F.3
Chazalviel, J.N.4
-
26
-
-
0029780707
-
-
Bansal, A.; Li, X. L.; Lauermann, I.; Lewis, N. S.; Yi, S. I.; Weinberg, W. H. J. Am. Chem. Soc. 1996, 118 (30), 7225-7226.
-
(1996)
J. Am. Chem. Soc.
, vol.118
, Issue.30
, pp. 7225-7226
-
-
Bansal, A.1
Li, X.L.2
Lauermann, I.3
Lewis, N.S.4
Yi, S.I.5
Weinberg, W.H.6
-
27
-
-
0035950764
-
-
Bansal, A.; Li, X. L.; Yi, S. I.; Weinberg, W. H.; Lewis, N. S. J. Phys. Chem. B 2001, 105 (42), 10266-10277.
-
(2001)
J. Phys. Chem. B
, vol.105
, Issue.42
, pp. 10266-10277
-
-
Bansal, A.1
Li, X.L.2
Yi, S.I.3
Weinberg, W.H.4
Lewis, N.S.5
-
28
-
-
0032540051
-
-
He, J.; Patitsas, S. N.; Preston, K. F.; Wolkow, R. A.; Wayner, D. D. M. Chem. Phys. Lett. 1998, 286 (5-6), 508-514.
-
(1998)
Chem. Phys. Lett.
, vol.286
, Issue.5-6
, pp. 508-514
-
-
He, J.1
Patitsas, S.N.2
Preston, K.F.3
Wolkow, R.A.4
Wayner, D.D.M.5
-
29
-
-
33749233464
-
-
Hunger, R.; Fritsche, R.; Jaeckel, B.; Jaegermann, W.; Webb, L. J.; Lewis, N. S. Phys. Rev. B 2005, 72 (4).
-
(2005)
Phys. Rev. B
, vol.72
, Issue.4
-
-
Hunger, R.1
Fritsche, R.2
Jaeckel, B.3
Jaegermann, W.4
Webb, L.J.5
Lewis, N.S.6
-
30
-
-
0035815017
-
-
Juang, A.; Scherman, O. A.; Grubbs, R. H.; Lewis, N. S. Langmuir 2001, 17(5), 1321-1323.
-
(2001)
Langmuir
, vol.17
, Issue.5
, pp. 1321-1323
-
-
Juang, A.1
Scherman, O.A.2
Grubbs, R.H.3
Lewis, N.S.4
-
31
-
-
0035252528
-
-
Okubo, T.; Tsuchiya, H.; Sadakata, M.; Yasuda, T.; Tanaka, K. Appl. Surf. Sci. 2001, 171 (3-4), 252-256.
-
(2001)
Appl. Surf. Sci.
, vol.171
, Issue.3-4
, pp. 252-256
-
-
Okubo, T.1
Tsuchiya, H.2
Sadakata, M.3
Yasuda, T.4
Tanaka, K.5
-
32
-
-
31144457510
-
-
Rivillon, S.; Chabal, Y. J.; Webb, L. J.; Michalak, D. J.; Lewis, N. S.; Halls, M. D.; Raghavachari, K. J. Vac. Sci. Technol., A 2005, 23 (4), 1100-1106.
-
(2005)
J. Vac. Sci. Technol., A
, vol.23
, Issue.4
, pp. 1100-1106
-
-
Rivillon, S.1
Chabal, Y.J.2
Webb, L.J.3
Michalak, D.J.4
Lewis, N.S.5
Halls, M.D.6
Raghavachari, K.7
-
33
-
-
0032620079
-
-
Terry, J.; Linford, M. R.; Wigren, C.; Cao, R. Y.; Pianetta, P.; Chidsey, C. E. D. J. Appl. Phys. 1999, 85 (1), 213-221.
-
(1999)
J. Appl. Phys.
, vol.85
, Issue.1
, pp. 213-221
-
-
Terry, J.1
Linford, M.R.2
Wigren, C.3
Cao, R.Y.4
Pianetta, P.5
Chidsey, C.E.D.6
-
34
-
-
13244260970
-
-
Yu, H. B.; Webb, L. J.; Ries, R. S.; Solares, S. D.; Goddard, W. A.; Heath, J. R.; Lewis, N. S. J. Phys. Chem. B 2005, 109 (2), 671-674.
-
(2005)
J. Phys. Chem. B
, vol.109
, Issue.2
, pp. 671-674
-
-
Yu, H.B.1
Webb, L.J.2
Ries, R.S.3
Solares, S.D.4
Goddard, W.A.5
Heath, J.R.6
Lewis, N.S.7
-
35
-
-
84906373217
-
-
Submitted for publication
-
Solares, S. D.; Yu, H. B.; Webb, L. J.; Lewis, N. S.; Heath, J. R.; Goddard, W. A. J. Am. Chem. Soc. Submitted for publication.
-
J. Am. Chem. Soc.
-
-
Solares, S.D.1
Yu, H.B.2
Webb, L.J.3
Lewis, N.S.4
Heath, J.R.5
Goddard, W.A.6
-
36
-
-
0033826115
-
-
Yu, H. Z.; Boukherroub, R.; Morin, S.; Wayner, D. D. M. Electrochem. Commun. 2000, 2 (8), 562-566.
-
(2000)
Electrochem. Commun.
, vol.2
, Issue.8
, pp. 562-566
-
-
Yu, H.Z.1
Boukherroub, R.2
Morin, S.3
Wayner, D.D.M.4
-
37
-
-
84906402020
-
-
Submitted for publication
-
Yu, H. B.; Webb, L. J.; Solares, S. D.; Cao, P.; Goddard, W. A.; Heath, J. R.; Lewis, N. S. J. Phys. Chem. B Submitted for publication.
-
J. Phys. Chem. B
-
-
Yu, H.B.1
Webb, L.J.2
Solares, S.D.3
Cao, P.4
Goddard, W.A.5
Heath, J.R.6
Lewis, N.S.7
-
38
-
-
84906387374
-
-
Hurley, P. T.; Lewis, N. S. To be submitted
-
Hurley, P. T.; Lewis, N. S. To be submitted.
-
-
-
-
39
-
-
0037149783
-
-
Gstrein, F.; Michalak, D. J.; Royea, W. J.; Lewis, N. S. J. Phys. Chem. B 2002, 106 (11), 2950-2961.
-
(2002)
J. Phys. Chem. B
, vol.106
, Issue.11
, pp. 2950-2961
-
-
Gstrein, F.1
Michalak, D.J.2
Royea, W.J.3
Lewis, N.S.4
-
41
-
-
0028439305
-
-
Msaad, H.; Michel, J.; Lappe, J. J.; Kimerling, L. C. J. Electron. Mater. 1994, 23 (5), 487-491.
-
(1994)
J. Electron. Mater.
, vol.23
, Issue.5
, pp. 487-491
-
-
Msaad, H.1
Michel, J.2
Lappe, J.J.3
Kimerling, L.C.4
-
42
-
-
0029360299
-
-
Msaad, H.; Michel, J.; Reddy, A.; Kimerling, L. C. J. Electrochem. Soc. 1995, 142 (8), 2833-2835.
-
(1995)
J. Electrochem. Soc.
, vol.142
, Issue.8
, pp. 2833-2835
-
-
Msaad, H.1
Michel, J.2
Reddy, A.3
Kimerling, L.C.4
-
43
-
-
0001203966
-
-
Royea, W. J.; Michalak, D. J.; Lewis, N. S. Appl. Phys. Lett. 2000, 77 (16), 2566-2568.
-
(2000)
Appl. Phys. Lett.
, vol.77
, Issue.16
, pp. 2566-2568
-
-
Royea, W.J.1
Michalak, D.J.2
Lewis, N.S.3
-
44
-
-
0037076133
-
-
Cai, W.; Lin, Z.; Strother, T.; Smith, L. M.; Hamers, R. J. J. Phys. Chem. B 2002, 106 (10), 2656-2664.
-
(2002)
J. Phys. Chem. B
, vol.106
, Issue.10
, pp. 2656-2664
-
-
Cai, W.1
Lin, Z.2
Strother, T.3
Smith, L.M.4
Hamers, R.J.5
-
45
-
-
12844273017
-
Silicon surface defects: The roles of passivation and surface contamination
-
Transtec Publications Ltd.: Zurich-Uetikon, Icds-19, Pts 1-3
-
Reddy, A. J.; Burr, T. A.; Chan, J. K.; Norga, G. J.; Michel, J.; Kimerling, L. C. Silicon surface defects: The roles of passivation and surface contamination, In Defects in Semiconductors; Transtec Publications Ltd.: Zurich-Uetikon, 1997; Vol. 258-2, Icds-19, Pts 1-3, pp 1719-1724.
-
(1997)
Defects in Semiconductors
, vol.258
, Issue.2
, pp. 1719-1724
-
-
Reddy, A.J.1
Burr, T.A.2
Chan, J.K.3
Norga, G.J.4
Michel, J.5
Kimerling, L.C.6
-
46
-
-
0033348770
-
-
Reddy, A. J.; Chan, J. V.; Burr, T. A.; Mo, R.; Wade, C. P.; Chidsey, C. E. D.; Michel, J.; Kimerling, L. C. Physica B 1999, 274, 468-472.
-
(1999)
Physica B
, vol.274
, pp. 468-472
-
-
Reddy, A.J.1
Chan, J.V.2
Burr, T.A.3
Mo, R.4
Wade, C.P.5
Chidsey, C.E.D.6
Michel, J.7
Kimerling, L.C.8
-
47
-
-
33646424012
-
-
Sandia National Labs, Albuquerque, NM
-
Schultz, P. A. SeqQuest; Sandia National Labs, Albuquerque, NM; http://dft.sandia.gov/Quest/.
-
SeqQuest
-
-
Schultz, P.A.1
-
48
-
-
4243943295
-
-
Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1996, 77 (18), 3865-3868.
-
(1996)
Phys. Rev. Lett.
, vol.77
, Issue.18
, pp. 3865-3868
-
-
Perdew, J.P.1
Burke, K.2
Ernzerhof, M.3
-
49
-
-
29844453509
-
-
Solares, S. D.; Dasgupta, S.; Schultz, P. A.; Kim, Y. H.; Musgrave, C. B.; Goddard, W. A., Ill Langmuir 2005, 21, 12404-12414.
-
(2005)
Langmuir
, vol.21
, pp. 12404-12414
-
-
Solares, S.D.1
Dasgupta, S.2
Schultz, P.A.3
Kim, Y.H.4
Musgrave, C.B.5
Goddard III, W.A.6
-
50
-
-
4243469916
-
-
Itchkawitz, B. S.; McEllistrem, M. T.; Boland, J. J. Phys. Rev. Left. 1997, 78(1), 98-101.
-
(1997)
J. Phys. Rev. Left.
, vol.78
, Issue.1
, pp. 98-101
-
-
Itchkawitz, B.S.1
McEllistrem, M.T.2
Boland, J.3
|