Use of near-surface channel conductance and differential capacitance versus potential measurements to correlate inversion layer formation with low effective surface recombination velocities at n-Si/liquid contacts

Applied Physics Letters

Volumn 80, Issue 23, 2002, Pages 4458-4460

  Michalak, David J ^a   Lewis, Nathan S ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL CONDUCTANCE; DECAMETHYLFERROCENE; DIFFERENTIAL CAPACITANCE; FERROCENES; INVERSION LAYER; LIQUID ELECTROLYTES; NEAR-SURFACE; POTENTIAL MEASUREMENTS; SI SURFACES; SOLID/LIQUID; SURFACE RECOMBINATION VELOCITIES; TETRA-HYDROFURAN;

IRON COMPOUNDS; METHANOL; ORGANOMETALLICS; VELOCITY MEASUREMENT;

CAPACITANCE;

EID: 79956018658     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1479456     Document Type: Article

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