메뉴 건너뛰기




Volumn 52, Issue 5, 2006, Pages 257-271

Software-based self-testing of microprocessors

Author keywords

Coverage analysis; HW SW test co design; Microprocessors; Software based self test

Indexed keywords

COMPUTER HARDWARE; COMPUTER SOFTWARE; CONSTRAINT THEORY; STATISTICAL METHODS;

EID: 33645871282     PISSN: 13837621     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sysarc.2005.05.004     Document Type: Article
Times cited : (21)

References (29)
  • 2
    • 0032691811 scopus 로고    scopus 로고
    • K. Batcher, Ch. Papachristou, Instruction randomization self test for processor cores, in: Proc. of IEEE VLSI Test Symposium, 1999, pp. 34-40.
  • 3
    • 79957543174 scopus 로고    scopus 로고
    • B. Bhavsar, R.A. Davies, Scan Island-a scan partitioning architecture and its implementation on the Alpha 21364 processor, in: Proc. of IEEE VLSI Test Symposium, 2002, pp. 16-22.
  • 5
    • 0035272504 scopus 로고    scopus 로고
    • Software based self-testing methodology for processor cores
    • Chen L., and Dey S. Software based self-testing methodology for processor cores. IEEE Transactions on Computer Aided Design 20 3 (2001) 369-380
    • (2001) IEEE Transactions on Computer Aided Design , vol.20 , Issue.3 , pp. 369-380
    • Chen, L.1    Dey, S.2
  • 6
    • 0042134725 scopus 로고    scopus 로고
    • L. Chen, S. Ravi, A. Raghunathan, S. Dey, A scalable software based self-test methodology for programmable processors, in: Proc. of Design Automation Conference, 2003, pp. 548-553.
  • 7
    • 1642612182 scopus 로고    scopus 로고
    • F. Corno, G. Cumani, M.S. Reorda, G. Squillerpo, Fully automatic program generation for microprocessor cores, in: Proc. of IEEE Design Automation and Test in Europe Conference, 2003, pp. 1006-1011.
  • 9
    • 0042635846 scopus 로고    scopus 로고
    • S. Fine, A. Ziv, Coverage directed test generation for functional verification of using Bayesian networks, in: Proc. of Design Automation Conference, 2003, pp. 286-291.
  • 10
    • 85176994966 scopus 로고    scopus 로고
    • A.J. van de Goor, Th.J.W. Verhallen, Functional testing of current microprocessors, in: Proc. of IEEE Int. Test Conference, 1992, pp. 684-695.
  • 11
    • 13244291306 scopus 로고    scopus 로고
    • K. Kambe, M. Inoue, H. Fujiwara, Efficient template generation for instruction-based self-test of processor cores, in: Proc. of IEEE Asian Test Symposium, 2004, pp. 151-158.
  • 12
    • 1642612186 scopus 로고    scopus 로고
    • N. Kranitis, G. Xenoulis, A. Paschalis, D. Gizopoulos, Y. Zorian, Low cost software based self-testing of RISC processor cores, in: Proc. of IEEE Design Automation and Test in Europe Conference, 2003, pp. 714-719.
  • 13
    • 0142246920 scopus 로고    scopus 로고
    • N. Kranitis, G. Xenoulis, A. Paschalis, D. Gizopoulos, Y. Zorian, Application and analysis of RTL-level software based self-testing for embedded processor cores, in: Proc. of IEEE Int. Test Conference, 2003. pp. 715-785.
  • 14
    • 0036059626 scopus 로고    scopus 로고
    • A. Krstic, W.C. Lai, L. Chen, K.-T. Cheng, S. Dey, Embedded software based self-testing of SoC design, in: Proc. of Design Automation Conference, 2002, pp. 355-359.
  • 15
    • 33646944392 scopus 로고    scopus 로고
    • P. Mishra, N. Dutt, Functional coverage driven test generation for validation of pipelined processors, in: Proc. of the Design, Automation and Test in Europe Conference, 2005, pp. 678-683.
  • 17
    • 3042569000 scopus 로고    scopus 로고
    • H. Rizk, C. Papachristou, F. Wolff, Designing self test programs for embedded DSP cores, in: Proc. of the Design, Automation and Test in Europe Conference, 2004, pp. 816-823.
  • 18
    • 13244299000 scopus 로고    scopus 로고
    • S. Shamshiri, H. Esmaeilzadeh, Z. Navabi, Test instruction set for high level self-testing of CPU cores, in: Proc. of IEEE Asian Test Symposium, 2004, pp. 158-163.
  • 20
    • 0032681502 scopus 로고    scopus 로고
    • J. Shen, J.A. Abraham, Verification of processor microarchitectures, in: Proc. of IEEE VLSI Test Symposium, 1999, pp. 189-194.
  • 21
    • 2342642060 scopus 로고    scopus 로고
    • V. Singh, M. Inoue, K.K. Saluja, H. Fujiwara, Instruction-based delay fault self-testing of processor cores, in: Proc. of Int. Conf. on VLSI Design, 2004, pp. 933-938.
  • 22
    • 0029489002 scopus 로고    scopus 로고
    • J. Sosnowski, In system testing of cache memories, in: Proc. of IEEE Int. Test Conference, 1995, pp. 384-393.
  • 23
    • 84958956589 scopus 로고    scopus 로고
    • J. Sosnowski, A. Kusmierczyk, Pseudorandom testing of microprocessors at instruction/data flow level, in: Proc. of 2nd European Dependable Computing Conference, Springer, 1996, pp. 246-263.
  • 24
    • 80052093108 scopus 로고    scopus 로고
    • J. Sosnowski, T. Bech, Extensive testing of floating point unit, in: Proc. of Euromicro Conference, IEEE Comp. Society, 2001, pp. 180-187.
  • 25
    • 33645847762 scopus 로고    scopus 로고
    • J. Sosnowski A. Lesiak, P. Gawkowski, P. Włodawiec (2003). Software implemented fault inserters. in: Proc. of IFAC Workshop on Programmable Devices, 2003, pp. 427-432.
  • 26
    • 84983158553 scopus 로고    scopus 로고
    • J. Sosnowski, R. Jurkiewicz, J. Nowicki, Experimental evaluation of CPU performance features, in: Proc. of Digital System Design Symposium, IEEE Comp. Society, 2001 pp. 194-2001.
  • 28
    • 0032715240 scopus 로고    scopus 로고
    • N. Utamaphethai, R.D. Blanton, J.P. Shen, Superscalar processor validation at microarchitecture level, in: Proc of IEEE International Symposium on VLSI Design, 1999, pp. 300-305.
  • 29
    • 85064445218 scopus 로고    scopus 로고
    • A. Wilczyński, J. Sosnowski, P. Gawkowski, Flexible microcontroller simulator for testing purposes, in: Proc. of IFAC Workshop on Programmable Devices and Systems, 2004, pp. 310-315.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.