Extensive testing of floating point unit

Conference Proceedings of the EUROMICRO

Volumn 1, Issue , 2000, Pages 180-187

  Sosnowski, Janusz ^a   Bech, Tomasz ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION-ORIENTED; EXHAUSTIVE TESTING; EXTENSIVE TESTING; FAULT COVERAGES; FLOATING POINT UNITS; IEEE-754; PSEUDO RANDOM; TEST PROGRAM;

MICROWAVE CIRCUITS;

EID: 80052093108     PISSN: 10896503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EURMIC.2000.874631     Document Type: Conference Paper

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