Fully automatic test program generation for microprocessor cores

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2003, Pages 1006-1011

  Corno, F ^a   Cumani, G ^a   Sonza Reorda, M ^a   Squillero, G ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY INSTRUCTIONS; AUTOMATIC TEST PROGRAM GENERATIONS; EFFECTIVE SOLUTION; FUNCTIONAL TESTING; HUMAN INTERVENTION; INTERNAL PARAMETERS; MICROPROCESSOR CORE; NEW APPROACHES;

EXHIBITIONS;

MICROPROCESSOR CHIPS;

EID: 1642612182     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253736     Document Type: Conference Paper

References (14)

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