SCOPUS 정보 검색 플랫폼

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2003, Pages 714-719

Low-cost software-based self-testing of RISC processor cores

(5) Kranitis, N a Xenoulis, G b Gizopoulos, D b Paschalis, A a Zorian, Y c

a UNIVERSITY OF ATHENS (Greece)

b UNIVERSITY OF PIRAEUS (Greece)

c Virage Logic (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED PROCESSORS; FAULT COVERAGES; PROCESSOR CORES; PROCESSOR MEMORY; PROCESSOR RESOURCES; RISC PROCESSORS; SOFTWARE BASED SELF TESTING; TESTING EFFORT;

COST ENGINEERING; EXHIBITIONS; REDUCED INSTRUCTION SET COMPUTING;

SOFTWARE TESTING;

EID: 1642612186 PISSN: 15301591 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/DATE.2003.1253691 Document Type: Conference Paper

Times cited : (16)

References (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.