Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 431-440

  Kranitis, N ^a   Xenoulis, G ^b   Paschalis, A ^a   Gizopoulos, D ^b   Zorian, Y ^c  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF PIRAEUS   (Greece)

^c Virage Logic   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER SOFTWARE; DESIGN FOR TESTABILITY;

PROCESSOR RESOURCES;

EMBEDDED SYSTEMS;

EID: 0142246920     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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