Coverage directed test generation for functional verification using Bayesian networks

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 286-291

  Fine, Shai ^a   Ziv, Avi ^a  

^a IBM HAIFA RESEARCH LAB   (Israel)

Author keywords

Bayesian Networks; Coverage Analysis; Functional Verification

Indexed keywords

ADAPTIVE SYSTEMS; CLOSED LOOP CONTROL SYSTEMS; COMPUTER SIMULATION; ENCODING (SYMBOLS); FEEDBACK; LEARNING SYSTEMS;

FUNCTIONAL VERIFICATION;

SYSTEMS ANALYSIS;

EID: 0042635846     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.775907     Document Type: Conference Paper

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