Embedded software-based self-testing for SoC design

Proceedings - Design Automation Conference

Volumn , Issue , 2002, Pages 355-360

  Krstic, Angela ^a   Lai, W C ^a   Chen, Li ^b   Cheng, K T ^a   Dey, S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Functional test; Microprocessor test; SoC test; VLSI test

Indexed keywords

SYSTEM-ON-CHIP (SOC) DESIGNS;

ALGORITHMS; COMPUTER SOFTWARE; DIGITAL SIGNAL PROCESSING; EMBEDDED SYSTEMS; INTERFACES (COMPUTER);

VLSI CIRCUITS;

EID: 0036059626     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2002.1012649     Document Type: Article

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